Pushing the thinness limit of silver films for flexible optoelectronic devices via ion-beam thinning-back process
Abstract Reducing the silver film to 10 nm theoretically allows higher transparency but in practice leads to degraded transparency and electrical conductivity because the ultrathin film tends to be discontinuous. Herein, we developed a thinning-back process to address this dilemma, in which silver f...
| Hlavní autoři: | , , , , , , , , |
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| Médium: | Článek |
| Jazyk: | English |
| Vydáno: |
Nature Portfolio
2024-03-01
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| Edice: | Nature Communications |
| On-line přístup: | https://doi.org/10.1038/s41467-024-46467-6 |