Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging

An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the intensity of incident radiation to the amount of visible light emitted. A thicker scintillator reduces the patient’s dose while decreasing the sharpness. A thin scintillator has an advantage in terms o...

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Main Authors: Bo Kyung Cha, Youngjin Lee, Kyuseok Kim
Format: Article
Language:English
Published: MDPI AG 2023-09-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/19/8185
_version_ 1797575140046798848
author Bo Kyung Cha
Youngjin Lee
Kyuseok Kim
author_facet Bo Kyung Cha
Youngjin Lee
Kyuseok Kim
author_sort Bo Kyung Cha
collection DOAJ
description An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the intensity of incident radiation to the amount of visible light emitted. A thicker scintillator reduces the patient’s dose while decreasing the sharpness. A thin scintillator has an advantage in terms of sharpness; however, its noise component increases. Thus, the proposed method converts the spatial resolution of radiographic images acquired from a normal-thickness scintillation detector into a thin-thickness scintillation detector. Note that noise amplification and artifacts were minimized as much as possible after non-blind deconvolution. To accomplish this, the proposed algorithm estimates the optimal point-spread function (PSF) when the structural similarity index (SSIM) and feature similarity index (FSIM) are the most similar between thick and thin scintillator images. Simulation and experimental results demonstrate the viability of the proposed method. Moreover, the deconvolution images obtained using the proposed scheme show an effective image restoration method in terms of the human visible system compared to that of the traditional PSF measurement technique. Consequently, the proposed method is useful for restoring degraded images using the adaptive PSF while preventing noise amplification and artifacts and is effective in improving the image quality in the present X-ray imaging system.
first_indexed 2024-03-10T21:34:18Z
format Article
id doaj.art-3a3589fd25db4e14b42756e7c4de80cf
institution Directory Open Access Journal
issn 1424-8220
language English
last_indexed 2024-03-10T21:34:18Z
publishDate 2023-09-01
publisher MDPI AG
record_format Article
series Sensors
spelling doaj.art-3a3589fd25db4e14b42756e7c4de80cf2023-11-19T15:03:58ZengMDPI AGSensors1424-82202023-09-012319818510.3390/s23198185Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray ImagingBo Kyung Cha0Youngjin Lee1Kyuseok Kim2Precision Medical Device Research Center, Korea Electrotechnology Research Institute (KERI), 111, Hanggaul-ro, Sangnok-gu, Ansan-si 15588, Gyeonggi-do, Republic of KoreaDepartment of Radiological Science, College of Health Science, Gachon University, 191, Hambangmoe-ro, Yeonsu-gu, Incheon 21936, Republic of KoreaDepartment of Biomedical Engineering, Eulji University, 553, Sanseong-daero, Sujeong-gu, Seongnam-si 13135, Gyeonggi-do, Republic of KoreaAn indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the intensity of incident radiation to the amount of visible light emitted. A thicker scintillator reduces the patient’s dose while decreasing the sharpness. A thin scintillator has an advantage in terms of sharpness; however, its noise component increases. Thus, the proposed method converts the spatial resolution of radiographic images acquired from a normal-thickness scintillation detector into a thin-thickness scintillation detector. Note that noise amplification and artifacts were minimized as much as possible after non-blind deconvolution. To accomplish this, the proposed algorithm estimates the optimal point-spread function (PSF) when the structural similarity index (SSIM) and feature similarity index (FSIM) are the most similar between thick and thin scintillator images. Simulation and experimental results demonstrate the viability of the proposed method. Moreover, the deconvolution images obtained using the proposed scheme show an effective image restoration method in terms of the human visible system compared to that of the traditional PSF measurement technique. Consequently, the proposed method is useful for restoring degraded images using the adaptive PSF while preventing noise amplification and artifacts and is effective in improving the image quality in the present X-ray imaging system.https://www.mdpi.com/1424-8220/23/19/8185image restorationnon-blind deconvolutionimage quality assessmentscintillator thicknessadaptive point-spread function
spellingShingle Bo Kyung Cha
Youngjin Lee
Kyuseok Kim
Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
Sensors
image restoration
non-blind deconvolution
image quality assessment
scintillator thickness
adaptive point-spread function
title Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
title_full Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
title_fullStr Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
title_full_unstemmed Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
title_short Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
title_sort development of adaptive point spread function estimation method in various scintillation detector thickness for x ray imaging
topic image restoration
non-blind deconvolution
image quality assessment
scintillator thickness
adaptive point-spread function
url https://www.mdpi.com/1424-8220/23/19/8185
work_keys_str_mv AT bokyungcha developmentofadaptivepointspreadfunctionestimationmethodinvariousscintillationdetectorthicknessforxrayimaging
AT youngjinlee developmentofadaptivepointspreadfunctionestimationmethodinvariousscintillationdetectorthicknessforxrayimaging
AT kyuseokkim developmentofadaptivepointspreadfunctionestimationmethodinvariousscintillationdetectorthicknessforxrayimaging