Distance Metric Optimization-Driven Neural Network Learning Framework for Pattern Classification

Distance Metric Optimization-Driven Neural Network Learning Framework for Pattern Classification

As a novel neural network learning framework, Twin Extreme Learning Machine (TELM) has received extensive attention and research in the field of machine learning. However, TELM is affected by noise or outliers in practical applications so that its generalization performance is reduced compared to ro...

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Bibliographic Details
Main Authors: Yimeng Jiang, Guolin Yu, Jun Ma
Format: Article
Language:English
Published: MDPI AG 2023-08-01
Series:Axioms
Subjects:
neural network
twin extreme learning machine
distance metric
robustness
pattern classification
Online Access:https://www.mdpi.com/2075-1680/12/8/765

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