Ferroelectricity in Epitaxial Tetragonal ZrO2 Thin Films

Ferroelectricity in Epitaxial Tetragonal ZrO2 Thin Films

Abstract The crystal structure and ferroelectric properties of epitaxial ZrO2 films ranging from 7 to 42 nm thickness grown on La0.67Sr0.33MnO3 buffered (110)‐oriented SrTiO3 substrate are reported. By employing X‐ray diffraction, a tetragonal phase (t‐phase) at all investigated thicknesses, with sl...

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Bibliographic Details
Main Authors: Ali El Boutaybi, Thomas Maroutian, Ludovic Largeau, Nathaniel Findling, Jean‐Blaise Brubach, Rebecca Cervasio, Alban Degezelle, Sylvia Matzen, Laurent Vivien, Pascale Roy, Panagiotis Karamanis, Michel Rérat, Philippe Lecoeur
Format: Article
Language:English
Published: Wiley-VCH 2024-01-01
Series:Advanced Electronic Materials
Subjects:
epitaxy
ferroelectrics
infrared
tetragonal
zirconia
ZrO2
Online Access:https://doi.org/10.1002/aelm.202300516

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