Rapid optical determination of topological insulator nanoplate thickness and oxidation
The stability of 2D antimony telluride (Sb2Te3) nanoplates in ambient conditions is elucidated. These materials exhibit an anisotropic oxidation mode, and CVD synthesized samples oxidize at a much faster rate than exfoliated samples investigated in previous studies. Optical measurement techniques ar...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-01-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4973403 |
| _version_ | 1819057621305393152 |
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| author | Fan Yang Mariana Sendova Robin B. Jacobs-Gedrim Eui Sang Song Avery Green Peter Thiesen Alain Diebold Bin Yu |
| author_facet | Fan Yang Mariana Sendova Robin B. Jacobs-Gedrim Eui Sang Song Avery Green Peter Thiesen Alain Diebold Bin Yu |
| author_sort | Fan Yang |
| collection | DOAJ |
| description | The stability of 2D antimony telluride (Sb2Te3) nanoplates in ambient conditions is elucidated. These materials exhibit an anisotropic oxidation mode, and CVD synthesized samples oxidize at a much faster rate than exfoliated samples investigated in previous studies. Optical measurement techniques are introduced to rapidly measure the oxidation modes and thickness of 2D materials. Auger characterization were conducted to confirm that oxygen replaces tellurium as opposed to antimony under ambient conditions. No surface morphology evolution was detected in AFM before and after exposure to air. These techniques were employed to determine the origin of the thickness dependent color change effect in Sb2Te3. It is concluded that this effect is a combination of refractive index change due to oxidation and Fresnel effects. |
| first_indexed | 2024-12-21T13:42:13Z |
| format | Article |
| id | doaj.art-3b4f38cd203a4baeb43141c497b2d5db |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-12-21T13:42:13Z |
| publishDate | 2017-01-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-3b4f38cd203a4baeb43141c497b2d5db2022-12-21T19:01:59ZengAIP Publishing LLCAIP Advances2158-32262017-01-0171015114015114-810.1063/1.4973403066612ADVRapid optical determination of topological insulator nanoplate thickness and oxidationFan Yang0Mariana Sendova1Robin B. Jacobs-Gedrim2Eui Sang Song3Avery Green4Peter Thiesen5Alain Diebold6Bin Yu7College of Nanoscale Science and Engineering, State University of New York, 253 Fuller Rd., Albany, NY 12203, USANew College of Florida, 5800 Bay Shore Rd., Sarasota, FL 34243, USACollege of Nanoscale Science and Engineering, State University of New York, 253 Fuller Rd., Albany, NY 12203, USACollege of Nanoscale Science and Engineering, State University of New York, 253 Fuller Rd., Albany, NY 12203, USACollege of Nanoscale Science and Engineering, State University of New York, 253 Fuller Rd., Albany, NY 12203, USAAccurion Gmbh, Stresemannstraße 30, 37079 Göttingen, GermanyCollege of Nanoscale Science and Engineering, State University of New York, 253 Fuller Rd., Albany, NY 12203, USACollege of Nanoscale Science and Engineering, State University of New York, 253 Fuller Rd., Albany, NY 12203, USAThe stability of 2D antimony telluride (Sb2Te3) nanoplates in ambient conditions is elucidated. These materials exhibit an anisotropic oxidation mode, and CVD synthesized samples oxidize at a much faster rate than exfoliated samples investigated in previous studies. Optical measurement techniques are introduced to rapidly measure the oxidation modes and thickness of 2D materials. Auger characterization were conducted to confirm that oxygen replaces tellurium as opposed to antimony under ambient conditions. No surface morphology evolution was detected in AFM before and after exposure to air. These techniques were employed to determine the origin of the thickness dependent color change effect in Sb2Te3. It is concluded that this effect is a combination of refractive index change due to oxidation and Fresnel effects.http://dx.doi.org/10.1063/1.4973403 |
| spellingShingle | Fan Yang Mariana Sendova Robin B. Jacobs-Gedrim Eui Sang Song Avery Green Peter Thiesen Alain Diebold Bin Yu Rapid optical determination of topological insulator nanoplate thickness and oxidation AIP Advances |
| title | Rapid optical determination of topological insulator nanoplate thickness and oxidation |
| title_full | Rapid optical determination of topological insulator nanoplate thickness and oxidation |
| title_fullStr | Rapid optical determination of topological insulator nanoplate thickness and oxidation |
| title_full_unstemmed | Rapid optical determination of topological insulator nanoplate thickness and oxidation |
| title_short | Rapid optical determination of topological insulator nanoplate thickness and oxidation |
| title_sort | rapid optical determination of topological insulator nanoplate thickness and oxidation |
| url | http://dx.doi.org/10.1063/1.4973403 |
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