In Situ Exfoliation Method of Large‐Area 2D Materials
Abstract 2D materials provide a rich platform to study novel physical phenomena arising from quantum confinement of charge carriers. Many of these phenomena are discovered by surface sensitive techniques, such as photoemission spectroscopy, that work in ultra‐high vacuum (UHV). Success in experiment...
| Main Authors: | , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
2023-08-01
|
| Series: | Advanced Science |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/advs.202301243 |
| _version_ | 1827877442148106240 |
|---|---|
| author | Antonija Grubišić‐Čabo Matteo Michiardi Charlotte E. Sanders Marco Bianchi Davide Curcio Dibya Phuyal Magnus H. Berntsen Qinda Guo Maciej Dendzik |
| author_facet | Antonija Grubišić‐Čabo Matteo Michiardi Charlotte E. Sanders Marco Bianchi Davide Curcio Dibya Phuyal Magnus H. Berntsen Qinda Guo Maciej Dendzik |
| author_sort | Antonija Grubišić‐Čabo |
| collection | DOAJ |
| description | Abstract 2D materials provide a rich platform to study novel physical phenomena arising from quantum confinement of charge carriers. Many of these phenomena are discovered by surface sensitive techniques, such as photoemission spectroscopy, that work in ultra‐high vacuum (UHV). Success in experimental studies of 2D materials, however, inherently relies on producing adsorbate‐free, large‐area, high‐quality samples. The method that yields 2D materials of highest quality is mechanical exfoliation from bulk‐grown samples. However, as this technique is traditionally performed in a dedicated environment, the transfer of samples into vacuum requires surface cleaning that might diminish the quality of the samples. In this article, a simple method for in situ exfoliation directly in UHV is reported, which yields large‐area, single‐layered films. Multiple metallic and semiconducting transition metal dichalcogenides are exfoliated in situ onto Au, Ag, and Ge. The exfoliated flakes are found to be of sub‐millimeter size with excellent crystallinity and purity, as supported by angle‐resolved photoemission spectroscopy, atomic force microscopy, and low‐energy electron diffraction. The approach is well‐suited for air‐sensitive 2D materials, enabling the study of a new suite of electronic properties. In addition, the exfoliation of surface alloys and the possibility of controlling the substrate‐2D material twist angle is demonstrated. |
| first_indexed | 2024-03-12T17:37:28Z |
| format | Article |
| id | doaj.art-3b86537cbd5241be8f4dabf1e7e16b51 |
| institution | Directory Open Access Journal |
| issn | 2198-3844 |
| language | English |
| last_indexed | 2024-03-12T17:37:28Z |
| publishDate | 2023-08-01 |
| publisher | Wiley |
| record_format | Article |
| series | Advanced Science |
| spelling | doaj.art-3b86537cbd5241be8f4dabf1e7e16b512023-08-04T07:49:49ZengWileyAdvanced Science2198-38442023-08-011022n/an/a10.1002/advs.202301243In Situ Exfoliation Method of Large‐Area 2D MaterialsAntonija Grubišić‐Čabo0Matteo Michiardi1Charlotte E. Sanders2Marco Bianchi3Davide Curcio4Dibya Phuyal5Magnus H. Berntsen6Qinda Guo7Maciej Dendzik8Zernike Institute for Advanced Materials University of Groningen Groningen 9747 AG The NetherlandsQuantum Matter Institute University of British Columbia Vancouver BC V6T 1Z4 CanadaCentral Laser Facility Research Complex at Harwell Rutherford Appleton Laboratory Harwell Campus Didcot 0X11 0QX UKSchool of Physics and Astronomy Aarhus University Aarhus 8000 C DenmarkSchool of Physics and Astronomy Aarhus University Aarhus 8000 C DenmarkDepartment of Applied Physics KTH Royal Institute of Technology Hannes Alfvéns väg 12 Stockholm 114 19 SwedenDepartment of Applied Physics KTH Royal Institute of Technology Hannes Alfvéns väg 12 Stockholm 114 19 SwedenDepartment of Applied Physics KTH Royal Institute of Technology Hannes Alfvéns väg 12 Stockholm 114 19 SwedenDepartment of Applied Physics KTH Royal Institute of Technology Hannes Alfvéns väg 12 Stockholm 114 19 SwedenAbstract 2D materials provide a rich platform to study novel physical phenomena arising from quantum confinement of charge carriers. Many of these phenomena are discovered by surface sensitive techniques, such as photoemission spectroscopy, that work in ultra‐high vacuum (UHV). Success in experimental studies of 2D materials, however, inherently relies on producing adsorbate‐free, large‐area, high‐quality samples. The method that yields 2D materials of highest quality is mechanical exfoliation from bulk‐grown samples. However, as this technique is traditionally performed in a dedicated environment, the transfer of samples into vacuum requires surface cleaning that might diminish the quality of the samples. In this article, a simple method for in situ exfoliation directly in UHV is reported, which yields large‐area, single‐layered films. Multiple metallic and semiconducting transition metal dichalcogenides are exfoliated in situ onto Au, Ag, and Ge. The exfoliated flakes are found to be of sub‐millimeter size with excellent crystallinity and purity, as supported by angle‐resolved photoemission spectroscopy, atomic force microscopy, and low‐energy electron diffraction. The approach is well‐suited for air‐sensitive 2D materials, enabling the study of a new suite of electronic properties. In addition, the exfoliation of surface alloys and the possibility of controlling the substrate‐2D material twist angle is demonstrated.https://doi.org/10.1002/advs.2023012432D materialsangle‐resolved photoemission spectroscopyband structureexfoliationtransition metal dichalcogenides |
| spellingShingle | Antonija Grubišić‐Čabo Matteo Michiardi Charlotte E. Sanders Marco Bianchi Davide Curcio Dibya Phuyal Magnus H. Berntsen Qinda Guo Maciej Dendzik In Situ Exfoliation Method of Large‐Area 2D Materials Advanced Science 2D materials angle‐resolved photoemission spectroscopy band structure exfoliation transition metal dichalcogenides |
| title | In Situ Exfoliation Method of Large‐Area 2D Materials |
| title_full | In Situ Exfoliation Method of Large‐Area 2D Materials |
| title_fullStr | In Situ Exfoliation Method of Large‐Area 2D Materials |
| title_full_unstemmed | In Situ Exfoliation Method of Large‐Area 2D Materials |
| title_short | In Situ Exfoliation Method of Large‐Area 2D Materials |
| title_sort | in situ exfoliation method of large area 2d materials |
| topic | 2D materials angle‐resolved photoemission spectroscopy band structure exfoliation transition metal dichalcogenides |
| url | https://doi.org/10.1002/advs.202301243 |
| work_keys_str_mv | AT antonijagrubisiccabo insituexfoliationmethodoflargearea2dmaterials AT matteomichiardi insituexfoliationmethodoflargearea2dmaterials AT charlotteesanders insituexfoliationmethodoflargearea2dmaterials AT marcobianchi insituexfoliationmethodoflargearea2dmaterials AT davidecurcio insituexfoliationmethodoflargearea2dmaterials AT dibyaphuyal insituexfoliationmethodoflargearea2dmaterials AT magnushberntsen insituexfoliationmethodoflargearea2dmaterials AT qindaguo insituexfoliationmethodoflargearea2dmaterials AT maciejdendzik insituexfoliationmethodoflargearea2dmaterials |