Corn Grain Yield Prediction and Mapping from Unmanned Aerial System (UAS) Multispectral Imagery

Harvester-mounted yield monitor sensors are expensive and require calibration and data cleaning. Therefore, we evaluated six vegetation indices (VI) from unmanned aerial system (Quantix™ Mapper) imagery for corn (<i>Zea mays</i> L.) yield prediction. A field trial was conducted with N si...

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Main Authors: S. Sunoj, Jason Cho, Joe Guinness, Jan van Aardt, Karl J. Czymmek, Quirine M. Ketterings
Format: Article
Language:English
Published: MDPI AG 2021-10-01
Series:Remote Sensing
Subjects:
Online Access:https://www.mdpi.com/2072-4292/13/19/3948
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author S. Sunoj
Jason Cho
Joe Guinness
Jan van Aardt
Karl J. Czymmek
Quirine M. Ketterings
author_facet S. Sunoj
Jason Cho
Joe Guinness
Jan van Aardt
Karl J. Czymmek
Quirine M. Ketterings
author_sort S. Sunoj
collection DOAJ
description Harvester-mounted yield monitor sensors are expensive and require calibration and data cleaning. Therefore, we evaluated six vegetation indices (VI) from unmanned aerial system (Quantix™ Mapper) imagery for corn (<i>Zea mays</i> L.) yield prediction. A field trial was conducted with N sidedress treatments applied at four growth stages (V4, V6, V8, or V10) compared against zero-N and N-rich controls. Normalized difference vegetation index (NDVI) and enhanced vegetation index 2 (EVI2), based on flights at R4, resulted in the most accurate yield estimations, as long as sidedressing was performed before V6. Yield estimations based on earlier flights were less accurate. Estimations were most accurate when imagery from both N-rich and zero-N control plots were included, but elimination of the zero-N data only slightly reduced the accuracy. Use of a ratio approach (VI<sub>Trt</sub>/VI<sub>N-rich</sub> and Yield<sub>Trt</sub>/Yield<sub>N-rich</sub>) enables the extension of findings across fields and only slightly reduced the model performance. Finally, a smaller plot size (9 or 75 m<sup>2</sup> compared to 150 m<sup>2</sup>) resulted in a slightly reduced model performance. We concluded that accurate yield estimates can be obtained using NDVI and EVI2, as long as there is an N-rich strip in the field, sidedressing is performed prior to V6, and sensing takes place at R3 or R4.
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spelling doaj.art-3c0860db048d448080fa394247efd2052023-11-22T16:43:17ZengMDPI AGRemote Sensing2072-42922021-10-011319394810.3390/rs13193948Corn Grain Yield Prediction and Mapping from Unmanned Aerial System (UAS) Multispectral ImageryS. Sunoj0Jason Cho1Joe Guinness2Jan van Aardt3Karl J. Czymmek4Quirine M. Ketterings5Nutrient Management Spear Program, Department of Animal Science, Cornell University, Ithaca, NY 14853, USANutrient Management Spear Program, Department of Animal Science, Cornell University, Ithaca, NY 14853, USADepartment of Statistics and Data Science, Cornell University, Ithaca, NY 14853, USACenter for Imaging Science, Rochester Institute of Technology, Rochester, NY 14623, USANutrient Management Spear Program, Department of Animal Science, Cornell University, Ithaca, NY 14853, USANutrient Management Spear Program, Department of Animal Science, Cornell University, Ithaca, NY 14853, USAHarvester-mounted yield monitor sensors are expensive and require calibration and data cleaning. Therefore, we evaluated six vegetation indices (VI) from unmanned aerial system (Quantix™ Mapper) imagery for corn (<i>Zea mays</i> L.) yield prediction. A field trial was conducted with N sidedress treatments applied at four growth stages (V4, V6, V8, or V10) compared against zero-N and N-rich controls. Normalized difference vegetation index (NDVI) and enhanced vegetation index 2 (EVI2), based on flights at R4, resulted in the most accurate yield estimations, as long as sidedressing was performed before V6. Yield estimations based on earlier flights were less accurate. Estimations were most accurate when imagery from both N-rich and zero-N control plots were included, but elimination of the zero-N data only slightly reduced the accuracy. Use of a ratio approach (VI<sub>Trt</sub>/VI<sub>N-rich</sub> and Yield<sub>Trt</sub>/Yield<sub>N-rich</sub>) enables the extension of findings across fields and only slightly reduced the model performance. Finally, a smaller plot size (9 or 75 m<sup>2</sup> compared to 150 m<sup>2</sup>) resulted in a slightly reduced model performance. We concluded that accurate yield estimates can be obtained using NDVI and EVI2, as long as there is an N-rich strip in the field, sidedressing is performed prior to V6, and sensing takes place at R3 or R4.https://www.mdpi.com/2072-4292/13/19/3948corn yieldnitrogen sidedressprecision agricultureunmanned aerial systemsyield monitor
spellingShingle S. Sunoj
Jason Cho
Joe Guinness
Jan van Aardt
Karl J. Czymmek
Quirine M. Ketterings
Corn Grain Yield Prediction and Mapping from Unmanned Aerial System (UAS) Multispectral Imagery
Remote Sensing
corn yield
nitrogen sidedress
precision agriculture
unmanned aerial systems
yield monitor
title Corn Grain Yield Prediction and Mapping from Unmanned Aerial System (UAS) Multispectral Imagery
title_full Corn Grain Yield Prediction and Mapping from Unmanned Aerial System (UAS) Multispectral Imagery
title_fullStr Corn Grain Yield Prediction and Mapping from Unmanned Aerial System (UAS) Multispectral Imagery
title_full_unstemmed Corn Grain Yield Prediction and Mapping from Unmanned Aerial System (UAS) Multispectral Imagery
title_short Corn Grain Yield Prediction and Mapping from Unmanned Aerial System (UAS) Multispectral Imagery
title_sort corn grain yield prediction and mapping from unmanned aerial system uas multispectral imagery
topic corn yield
nitrogen sidedress
precision agriculture
unmanned aerial systems
yield monitor
url https://www.mdpi.com/2072-4292/13/19/3948
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