Optical studies of as-deposited and annealed Cu7GeS5I thin films

Cu7GeS5I thin films were obtained by non-reactive radio frequency magnetron sputtering onto silicate glass substrates. Optical transmission spectra of as-deposited and annealed Cu7GeS5I thin films were measured in the temperature interval 77–300 K. The temperature behaviour of Urbach absorption edge...

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Main Author: I.P. Studenyak
Format: Article
Language:English
Published: National Academy of Sciences of Ukraine. Institute of Semi conductor physics. 2019-07-01
Series:Semiconductor Physics, Quantum Electronics & Optoelectronics
Subjects:
Online Access:http://journal-spqeo.org.ua/n2_2016/P192-196abstr.html
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author I.P. Studenyak
author_facet I.P. Studenyak
author_sort I.P. Studenyak
collection DOAJ
description Cu7GeS5I thin films were obtained by non-reactive radio frequency magnetron sputtering onto silicate glass substrates. Optical transmission spectra of as-deposited and annealed Cu7GeS5I thin films were measured in the temperature interval 77–300 K. The temperature behaviour of Urbach absorption edge and dispersion of refractive index for as-deposited and annealed Cu7GeS5I thin films was analyzed. Influence of annealing on the optical parameters and disordering processes in Cu7GeS5I thin films was studied.
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last_indexed 2024-04-12T16:36:26Z
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publisher National Academy of Sciences of Ukraine. Institute of Semi conductor physics.
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spelling doaj.art-3c454bd03026429eadb34ef133050c952022-12-22T03:24:57ZengNational Academy of Sciences of Ukraine. Institute of Semi conductor physics.Semiconductor Physics, Quantum Electronics & Optoelectronics1560-80341605-65822019-07-0119219219610.15407/spqeo19.02.192Optical studies of as-deposited and annealed Cu7GeS5I thin filmsI.P. Studenyak0Uzhhorod National University, Faculty of Physics, 3, Narodna Sq., 88000 Uzhhorod, Ukraine Cu7GeS5I thin films were obtained by non-reactive radio frequency magnetron sputtering onto silicate glass substrates. Optical transmission spectra of as-deposited and annealed Cu7GeS5I thin films were measured in the temperature interval 77–300 K. The temperature behaviour of Urbach absorption edge and dispersion of refractive index for as-deposited and annealed Cu7GeS5I thin films was analyzed. Influence of annealing on the optical parameters and disordering processes in Cu7GeS5I thin films was studied.http://journal-spqeo.org.ua/n2_2016/P192-196abstr.htmlthin filmmagnetron sputteringannealingoptical absorptionrefractive indexurbach rule
spellingShingle I.P. Studenyak
Optical studies of as-deposited and annealed Cu7GeS5I thin films
Semiconductor Physics, Quantum Electronics & Optoelectronics
thin film
magnetron sputtering
annealing
optical absorption
refractive index
urbach rule
title Optical studies of as-deposited and annealed Cu7GeS5I thin films
title_full Optical studies of as-deposited and annealed Cu7GeS5I thin films
title_fullStr Optical studies of as-deposited and annealed Cu7GeS5I thin films
title_full_unstemmed Optical studies of as-deposited and annealed Cu7GeS5I thin films
title_short Optical studies of as-deposited and annealed Cu7GeS5I thin films
title_sort optical studies of as deposited and annealed cu7ges5i thin films
topic thin film
magnetron sputtering
annealing
optical absorption
refractive index
urbach rule
url http://journal-spqeo.org.ua/n2_2016/P192-196abstr.html
work_keys_str_mv AT ipstudenyak opticalstudiesofasdepositedandannealedcu7ges5ithinfilms