A Tunable Foreground Self-Calibration Scheme for Split Successive-Approximation Register Analog-to-Digital Converter

A Tunable Foreground Self-Calibration Scheme for Split Successive-Approximation Register Analog-to-Digital Converter

The capacitor mismatch among diverse defects caused by variations in the manufacturing process significantly affects the linearity of the capacitor array used to implement the capacitive digital-to-analog converter (CDAC) in the successive-approximation register (SAR) analog-to-digital converter (AD...

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Bibliographic Details
Main Authors: Joonsung Park, Jiwon Lee, Jacob A. Abraham, Byoungho Kim
Format: Article
Language:English
Published: MDPI AG 2024-02-01
Series:Electronics
Subjects:
self-testing
alternative testing
mixed-signal testing
manufacturing test
production test
built-in self-test (BIST)
Online Access:https://www.mdpi.com/2079-9292/13/4/755

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