Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acid
In this study, effect of potential on composition and depth profiles of passive films formed on 316L stainless steel in 0.05 M sulfuric acid has been examined using X-ray photoelectron spectroscopy (XPS). For passive film formation within the passive region, four potentials -0.2, 0.2, 0.5, and 0.8 V...
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| Format: | Article |
| Language: | fas |
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Isfahan University of Technology
2013-12-01
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| Series: | Journal of Advanced Materials in Engineering |
| Subjects: | |
| Online Access: | http://jame.iut.ac.ir/article-1-562-en.html |
| _version_ | 1818846920652619776 |
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| author | A. Fattah-alhosseini A. Saatchi M.A. Golozar K. Raeissi B. Bavarian |
| author_facet | A. Fattah-alhosseini A. Saatchi M.A. Golozar K. Raeissi B. Bavarian |
| author_sort | A. Fattah-alhosseini |
| collection | DOAJ |
| description | In this study, effect of potential on composition and depth profiles of passive films formed on 316L stainless steel in 0.05 M sulfuric acid has been examined using X-ray photoelectron spectroscopy (XPS). For passive film formation within the passive region, four potentials -0.2, 0.2, 0.5, and 0.8 VSCE were chosen and films were gown at each potential for 60 min. XPS analysis results showed that atomic concentration of Cr and Fe initially increase (E < 0.5 VSCE) and then decrease with potential. This decrease is due to surface dissolution of the Fe and Cr oxides. For both alloying elements, Ni and Mo, no obvious change in atomic concentration was showed. Results indicated that at higher potentials, before entering transpassive region, oxidation of Cr3+ to Cr6+ is happened. |
| first_indexed | 2024-12-19T05:53:13Z |
| format | Article |
| id | doaj.art-3d2089df6a02418db8393ed4577cdd9b |
| institution | Directory Open Access Journal |
| issn | 2251-600X 2423-5733 |
| language | fas |
| last_indexed | 2024-12-19T05:53:13Z |
| publishDate | 2013-12-01 |
| publisher | Isfahan University of Technology |
| record_format | Article |
| series | Journal of Advanced Materials in Engineering |
| spelling | doaj.art-3d2089df6a02418db8393ed4577cdd9b2022-12-21T20:33:32ZfasIsfahan University of TechnologyJournal of Advanced Materials in Engineering2251-600X2423-57332013-12-0132289100Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acidA. Fattah-alhosseini0A. Saatchi1M.A. Golozar2K. Raeissi3B. Bavarian4 Department of Materials Engineering, Bu-Ali Sina University Department of Materials Engineering, Isfahan University of Technology Department of Materials Engineering, Isfahan University of Technology Department of Materials Engineering, Isfahan University of Technology Department of Materials Engineering, North California University In this study, effect of potential on composition and depth profiles of passive films formed on 316L stainless steel in 0.05 M sulfuric acid has been examined using X-ray photoelectron spectroscopy (XPS). For passive film formation within the passive region, four potentials -0.2, 0.2, 0.5, and 0.8 VSCE were chosen and films were gown at each potential for 60 min. XPS analysis results showed that atomic concentration of Cr and Fe initially increase (E < 0.5 VSCE) and then decrease with potential. This decrease is due to surface dissolution of the Fe and Cr oxides. For both alloying elements, Ni and Mo, no obvious change in atomic concentration was showed. Results indicated that at higher potentials, before entering transpassive region, oxidation of Cr3+ to Cr6+ is happened.http://jame.iut.ac.ir/article-1-562-en.htmlx-ray photoelectron spectroscopy (xps)passive filmpotentialstainless steel |
| spellingShingle | A. Fattah-alhosseini A. Saatchi M.A. Golozar K. Raeissi B. Bavarian Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acid Journal of Advanced Materials in Engineering x-ray photoelectron spectroscopy (xps) passive film potential stainless steel |
| title | Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acid |
| title_full | Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acid |
| title_fullStr | Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acid |
| title_full_unstemmed | Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acid |
| title_short | Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acid |
| title_sort | effect of potential on composition and depth profiles of passive films formed on 316l in 0 05m sulfuric acid |
| topic | x-ray photoelectron spectroscopy (xps) passive film potential stainless steel |
| url | http://jame.iut.ac.ir/article-1-562-en.html |
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