Method for Improving the Reliability of SRAM-Based PUF Using Convolution Operation
This paper introduces a novel and efficient physical unclonable function (PUF) extraction method for SRAM. The proposed one-layer convolution scheme is based on a convolution operation, which significantly enhances the reliability of the PUF. To further reduce the hardware resources, a lightweight s...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-10-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/11/21/3493 |
| Summary: | This paper introduces a novel and efficient physical unclonable function (PUF) extraction method for SRAM. The proposed one-layer convolution scheme is based on a convolution operation, which significantly enhances the reliability of the PUF. To further reduce the hardware resources, a lightweight solution is presented based on a one-layer convolution scheme at the cost of a higher redundancy coefficient and a larger range for the inter-chip Hamming distance (HD). Both the above schemes only use certain hardware resources in the initial stage and the hardware resources are automatically released after PUF verification. The two schemes were verified using SRAM cells in three stm32f407 chips to output a 256-bit PUF response. The experimental results show that the one-layer convolution scheme required 8 KB SRAM, while the lightweight scheme used only 0.5 KB SRAM. The reliability of the one-layer convolution was found to be 100% when the redundancy coefficient was 0.08 and the inter-chip HD was 50.8073%. The reliability of the lightweight scheme was 100% and of the inter-chip HD was 50.195%. |
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| ISSN: | 2079-9292 |