Recent progress in the development of pulse compression gratings

The PETAL facility uses chirped pulse amplification (CPA) technique. This system needs large pulse compression gratings that request damage threshold better than 4 J/cm2 in normal beam at 1.053 μm for 500 fs pulses. In this paper, we will show recent grating designs with either multilayer dielectric...

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Main Authors: Hocquet S., Néauport J., Bonod N.
Format: Article
Language:English
Published: EDP Sciences 2013-11-01
Series:EPJ Web of Conferences
Online Access:http://dx.doi.org/10.1051/epjconf/20135907002
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author Hocquet S.
Néauport J.
Bonod N.
author_facet Hocquet S.
Néauport J.
Bonod N.
author_sort Hocquet S.
collection DOAJ
description The PETAL facility uses chirped pulse amplification (CPA) technique. This system needs large pulse compression gratings that request damage threshold better than 4 J/cm2 in normal beam at 1.053 μm for 500 fs pulses. In this paper, we will show recent grating designs with either multilayer dielectrics or hybrid metal-dielectric structures. We have shown in previous works that damage threshold is driven by the enhancement of the near electric field inside the pillars of the grating. This was evidenced from a macroscopic point of view by means of laser damage testing. We will show that damage morphology during damage initiation at the scale of the grating groove is also consistent with this electric field dependence.
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spelling doaj.art-3e3c4a3a326741c196fceab1822cf3362022-12-22T04:07:23ZengEDP SciencesEPJ Web of Conferences2100-014X2013-11-01590700210.1051/epjconf/20135907002Recent progress in the development of pulse compression gratingsHocquet S.Néauport J.Bonod N.The PETAL facility uses chirped pulse amplification (CPA) technique. This system needs large pulse compression gratings that request damage threshold better than 4 J/cm2 in normal beam at 1.053 μm for 500 fs pulses. In this paper, we will show recent grating designs with either multilayer dielectrics or hybrid metal-dielectric structures. We have shown in previous works that damage threshold is driven by the enhancement of the near electric field inside the pillars of the grating. This was evidenced from a macroscopic point of view by means of laser damage testing. We will show that damage morphology during damage initiation at the scale of the grating groove is also consistent with this electric field dependence.http://dx.doi.org/10.1051/epjconf/20135907002
spellingShingle Hocquet S.
Néauport J.
Bonod N.
Recent progress in the development of pulse compression gratings
EPJ Web of Conferences
title Recent progress in the development of pulse compression gratings
title_full Recent progress in the development of pulse compression gratings
title_fullStr Recent progress in the development of pulse compression gratings
title_full_unstemmed Recent progress in the development of pulse compression gratings
title_short Recent progress in the development of pulse compression gratings
title_sort recent progress in the development of pulse compression gratings
url http://dx.doi.org/10.1051/epjconf/20135907002
work_keys_str_mv AT hocquets recentprogressinthedevelopmentofpulsecompressiongratings
AT neauportj recentprogressinthedevelopmentofpulsecompressiongratings
AT bonodn recentprogressinthedevelopmentofpulsecompressiongratings