Size and temperature effects on dielectric breakdown of ferroelectric films

Abstract The paper introduces a model of dielectric breakdown strength. The model integrated thermal breakdown and defect models, representing the relationship between the electric field of ferroelectric films and dimensional parameters and operating temperature. This model is verified with experime...

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Detalhes bibliográficos
Autor principal: Sheng Tong
Formato: Artigo
Idioma:English
Publicado em: Tsinghua University Press 2021-01-01
Colecção:Journal of Advanced Ceramics
Assuntos:
Acesso em linha:https://doi.org/10.1007/s40145-020-0426-1