Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review
Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews s...
Main Authors: | Phuong Nguyen-Tri, Payman Ghassemi, Pascal Carriere, Sonil Nanda, Aymen Amine Assadi, Dinh Duc Nguyen |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-05-01
|
Series: | Polymers |
Subjects: | |
Online Access: | https://www.mdpi.com/2073-4360/12/5/1142 |
Similar Items
-
Systematic analysis and nanoscale chemical imaging of polymers using photothermal-induced resonance (AFM-IR) infrared spectroscopy
by: A. Catarina V.D. dos Santos, et al.
Published: (2022-02-01) -
The use of atomic force microscopy as an important technique to analyze the dispersion of nanometric fillers and morphology in nanocomposites and polymer blends based on elastomers
by: Fabiula Danielli Bastos de Sousa, et al.
Published: (2014-12-01) -
Miscibility and Phase Separation in PMMA/SAN Blends Investigated by Nanoscale AFM-IR
by: Julia Resch, et al.
Published: (2021-11-01) -
Mechanical Properties and Adhesion of a Micro Structured Polymer Blend
by: Brunero Cappella
Published: (2011-07-01) -
In-Process Atomic-Force Microscopy (AFM) Based Inspection
by: Samir Mekid
Published: (2017-05-01)