Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper
The variation rule of the Volta potential on deformed copper surfaces with the dislocation density is determined in this study by using electron back-scattered diffraction (EBSD) in conjunction with scanning Kelvin probe force microscopy (SKPFM). The results show that the Volta potential is not line...
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MDPI AG
2021-07-01
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Online Access: | https://www.mdpi.com/2075-4701/11/8/1166 |
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author | Yang Zhang Wei Shi Song Xiang |
author_facet | Yang Zhang Wei Shi Song Xiang |
author_sort | Yang Zhang |
collection | DOAJ |
description | The variation rule of the Volta potential on deformed copper surfaces with the dislocation density is determined in this study by using electron back-scattered diffraction (EBSD) in conjunction with scanning Kelvin probe force microscopy (SKPFM). The results show that the Volta potential is not linear in the dislocation density. When the dislocation density increases due to the deformation of pure copper, the Volta potential tends to a physical limit. The Volta potential exhibits a fractional function relationship with the dislocation density only for a relatively low shape variable. |
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institution | Directory Open Access Journal |
issn | 2075-4701 |
language | English |
last_indexed | 2024-03-10T08:36:00Z |
publishDate | 2021-07-01 |
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series | Metals |
spelling | doaj.art-3ed24f5984d4483dad4d2a5f528b171f2023-11-22T08:40:24ZengMDPI AGMetals2075-47012021-07-01118116610.3390/met11081166Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of CopperYang Zhang0Wei Shi1Song Xiang2College of Materials and Metallurgy, Guizhou University, Guiyang 550025, ChinaCollege of Materials and Metallurgy, Guizhou University, Guiyang 550025, ChinaCollege of Materials and Metallurgy, Guizhou University, Guiyang 550025, ChinaThe variation rule of the Volta potential on deformed copper surfaces with the dislocation density is determined in this study by using electron back-scattered diffraction (EBSD) in conjunction with scanning Kelvin probe force microscopy (SKPFM). The results show that the Volta potential is not linear in the dislocation density. When the dislocation density increases due to the deformation of pure copper, the Volta potential tends to a physical limit. The Volta potential exhibits a fractional function relationship with the dislocation density only for a relatively low shape variable.https://www.mdpi.com/2075-4701/11/8/1166SKPFMEBSDdislocation densityVolta potential |
spellingShingle | Yang Zhang Wei Shi Song Xiang Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper Metals SKPFM EBSD dislocation density Volta potential |
title | Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper |
title_full | Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper |
title_fullStr | Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper |
title_full_unstemmed | Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper |
title_short | Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper |
title_sort | using skpfm to determine the influence of deformation induced dislocations on the volta potential of copper |
topic | SKPFM EBSD dislocation density Volta potential |
url | https://www.mdpi.com/2075-4701/11/8/1166 |
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