Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper

The variation rule of the Volta potential on deformed copper surfaces with the dislocation density is determined in this study by using electron back-scattered diffraction (EBSD) in conjunction with scanning Kelvin probe force microscopy (SKPFM). The results show that the Volta potential is not line...

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Main Authors: Yang Zhang, Wei Shi, Song Xiang
Format: Article
Language:English
Published: MDPI AG 2021-07-01
Series:Metals
Subjects:
Online Access:https://www.mdpi.com/2075-4701/11/8/1166
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author Yang Zhang
Wei Shi
Song Xiang
author_facet Yang Zhang
Wei Shi
Song Xiang
author_sort Yang Zhang
collection DOAJ
description The variation rule of the Volta potential on deformed copper surfaces with the dislocation density is determined in this study by using electron back-scattered diffraction (EBSD) in conjunction with scanning Kelvin probe force microscopy (SKPFM). The results show that the Volta potential is not linear in the dislocation density. When the dislocation density increases due to the deformation of pure copper, the Volta potential tends to a physical limit. The Volta potential exhibits a fractional function relationship with the dislocation density only for a relatively low shape variable.
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spelling doaj.art-3ed24f5984d4483dad4d2a5f528b171f2023-11-22T08:40:24ZengMDPI AGMetals2075-47012021-07-01118116610.3390/met11081166Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of CopperYang Zhang0Wei Shi1Song Xiang2College of Materials and Metallurgy, Guizhou University, Guiyang 550025, ChinaCollege of Materials and Metallurgy, Guizhou University, Guiyang 550025, ChinaCollege of Materials and Metallurgy, Guizhou University, Guiyang 550025, ChinaThe variation rule of the Volta potential on deformed copper surfaces with the dislocation density is determined in this study by using electron back-scattered diffraction (EBSD) in conjunction with scanning Kelvin probe force microscopy (SKPFM). The results show that the Volta potential is not linear in the dislocation density. When the dislocation density increases due to the deformation of pure copper, the Volta potential tends to a physical limit. The Volta potential exhibits a fractional function relationship with the dislocation density only for a relatively low shape variable.https://www.mdpi.com/2075-4701/11/8/1166SKPFMEBSDdislocation densityVolta potential
spellingShingle Yang Zhang
Wei Shi
Song Xiang
Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper
Metals
SKPFM
EBSD
dislocation density
Volta potential
title Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper
title_full Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper
title_fullStr Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper
title_full_unstemmed Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper
title_short Using SKPFM to Determine the Influence of Deformation-Induced Dislocations on the Volta Potential of Copper
title_sort using skpfm to determine the influence of deformation induced dislocations on the volta potential of copper
topic SKPFM
EBSD
dislocation density
Volta potential
url https://www.mdpi.com/2075-4701/11/8/1166
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