Synchrotron total-scattering data applicable to dual-space structural analysis

Synchrotron total-scattering data applicable to dual-space structural analysis

Synchrotron powder X-ray diffraction (PXRD) is a well established technique for investigating the atomic arrangement of crystalline materials. At modern beamlines, X-ray scattering data can be collected in a total-scattering setting, which additionally opens up the opportunity for direct-space struc...

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Bibliographic Details
Main Authors:	Jonas Beyer, Kenichi Kato, Bo Brummerstedt Iversen
Format:	Article
Language:	English
Published:	International Union of Crystallography 2021-05-01
Series:	IUCrJ
Subjects:	dual-space structural analysis total-scattering data synchrotrons pair distribution functions powder x-ray diffraction
Online Access:	http://scripts.iucr.org/cgi-bin/paper?S2052252521001664

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