Characterization of Ag-Cu-S Thin Layers Formed on Low Density Polyethylene Film
The Ag-Cu-S layer formed on PE demonstrated a wide variation in thickness. The cross-section showed the average thickness of sulfide layers on PE increase from 1.9 mm to 5.6 mm with the increase in the sulfurization time and from 1.9 mm to 3.9 mm with the increase...
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| Format: | Article |
| Language: | English |
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Kaunas University of Technology
2011-09-01
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| Series: | Medžiagotyra |
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| Online Access: | http://matsc.ktu.lt/index.php/MatSc/article/view/584 |
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| author | Ingrida ANCUTIENĖ Remigijus IVANAUSKAS Nijolė KREIVĖNIENĖ |
| author_facet | Ingrida ANCUTIENĖ Remigijus IVANAUSKAS Nijolė KREIVĖNIENĖ |
| author_sort | Ingrida ANCUTIENĖ |
| collection | DOAJ |
| description | The Ag-Cu-S layer formed on PE demonstrated a wide variation in thickness. The cross-section showed the average thickness of sulfide layers on PE increase from 1.9 mm to 5.6 mm with the increase in the sulfurization time and from 1.9 mm to 3.9 mm with the increase of treating time in the solution of copper salts. The electronic micrographs of the sulfide layers indicate the creation of an irregular but continuous base of small dendrites and agglomerates. With the increase in the sulfurization time and treating time in copper (II/I) salt solution observed an increase of the agglomerates size. Energy dispersive spectroscopy results indicate that modified layers are poor in copper (0.5 at.<sub> </sub>%<sub> </sub>-<sub> </sub>1.5 at.<sub> </sub>%). The atomic ratios of Ag/Cu/S, calculated from the quantification of the peaks (excluded C and O elements) give the values (%) of 8.3:1.5:4.4, 8.7:0.5:4.3 and 23:1.2:10.9, respectively. In all cases, energy dispersive spectroscopy measurements revealed the modified layers are nearly stoichiometric Ag<sub>2</sub>S.<p><a href="http://dx.doi.org/10.5755/j01.ms.17.3.584">http://dx.doi.org/10.5755/j01.ms.17.3.584</a></p> |
| first_indexed | 2024-12-10T15:43:49Z |
| format | Article |
| id | doaj.art-3f6cbb52f47545f8ab1e8dfbaa41a04f |
| institution | Directory Open Access Journal |
| issn | 1392-1320 2029-7289 |
| language | English |
| last_indexed | 2024-12-10T15:43:49Z |
| publishDate | 2011-09-01 |
| publisher | Kaunas University of Technology |
| record_format | Article |
| series | Medžiagotyra |
| spelling | doaj.art-3f6cbb52f47545f8ab1e8dfbaa41a04f2022-12-22T01:43:02ZengKaunas University of TechnologyMedžiagotyra1392-13202029-72892011-09-0117322923110.5755/j01.ms.17.3.584497Characterization of Ag-Cu-S Thin Layers Formed on Low Density Polyethylene FilmIngrida ANCUTIENĖ0Remigijus IVANAUSKAS1Nijolė KREIVĖNIENĖ2Kaunas University of TechnologyKaunas University of TechnologyKaunas University of TechnologyThe Ag-Cu-S layer formed on PE demonstrated a wide variation in thickness. The cross-section showed the average thickness of sulfide layers on PE increase from 1.9 mm to 5.6 mm with the increase in the sulfurization time and from 1.9 mm to 3.9 mm with the increase of treating time in the solution of copper salts. The electronic micrographs of the sulfide layers indicate the creation of an irregular but continuous base of small dendrites and agglomerates. With the increase in the sulfurization time and treating time in copper (II/I) salt solution observed an increase of the agglomerates size. Energy dispersive spectroscopy results indicate that modified layers are poor in copper (0.5 at.<sub> </sub>%<sub> </sub>-<sub> </sub>1.5 at.<sub> </sub>%). The atomic ratios of Ag/Cu/S, calculated from the quantification of the peaks (excluded C and O elements) give the values (%) of 8.3:1.5:4.4, 8.7:0.5:4.3 and 23:1.2:10.9, respectively. In all cases, energy dispersive spectroscopy measurements revealed the modified layers are nearly stoichiometric Ag<sub>2</sub>S.<p><a href="http://dx.doi.org/10.5755/j01.ms.17.3.584">http://dx.doi.org/10.5755/j01.ms.17.3.584</a></p>http://matsc.ktu.lt/index.php/MatSc/article/view/584polyethylenepolythionic acidsulfurizationcopper sulfidesilver sulfidethin layer |
| spellingShingle | Ingrida ANCUTIENĖ Remigijus IVANAUSKAS Nijolė KREIVĖNIENĖ Characterization of Ag-Cu-S Thin Layers Formed on Low Density Polyethylene Film Medžiagotyra polyethylene polythionic acid sulfurization copper sulfide silver sulfide thin layer |
| title | Characterization of Ag-Cu-S Thin Layers Formed on Low Density Polyethylene Film |
| title_full | Characterization of Ag-Cu-S Thin Layers Formed on Low Density Polyethylene Film |
| title_fullStr | Characterization of Ag-Cu-S Thin Layers Formed on Low Density Polyethylene Film |
| title_full_unstemmed | Characterization of Ag-Cu-S Thin Layers Formed on Low Density Polyethylene Film |
| title_short | Characterization of Ag-Cu-S Thin Layers Formed on Low Density Polyethylene Film |
| title_sort | characterization of ag cu s thin layers formed on low density polyethylene film |
| topic | polyethylene polythionic acid sulfurization copper sulfide silver sulfide thin layer |
| url | http://matsc.ktu.lt/index.php/MatSc/article/view/584 |
| work_keys_str_mv | AT ingridaancutiene characterizationofagcusthinlayersformedonlowdensitypolyethylenefilm AT remigijusivanauskas characterizationofagcusthinlayersformedonlowdensitypolyethylenefilm AT nijolekreiveniene characterizationofagcusthinlayersformedonlowdensitypolyethylenefilm |