A self-referenced in-situ arrival time monitor for X-ray free-electron lasers

Abstract We present a novel, highly versatile, and self-referenced arrival time monitor for measuring the femtosecond time delay between a hard X-ray pulse from a free-electron laser and an optical laser pulse, measured directly on the same sample used for pump-probe experiments. Two chirped and pic...

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Main Authors: Michael Diez, Andreas Galler, Sebastian Schulz, Christina Boemer, Ryan N. Coffee, Nick Hartmann, Rupert Heider, Martin S. Wagner, Wolfram Helml, Tetsuo Katayama, Tokushi Sato, Takahiro Sato, Makina Yabashi, Christian Bressler
Format: Article
Language:English
Published: Nature Portfolio 2021-02-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-021-82597-3
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author Michael Diez
Andreas Galler
Sebastian Schulz
Christina Boemer
Ryan N. Coffee
Nick Hartmann
Rupert Heider
Martin S. Wagner
Wolfram Helml
Tetsuo Katayama
Tokushi Sato
Takahiro Sato
Makina Yabashi
Christian Bressler
author_facet Michael Diez
Andreas Galler
Sebastian Schulz
Christina Boemer
Ryan N. Coffee
Nick Hartmann
Rupert Heider
Martin S. Wagner
Wolfram Helml
Tetsuo Katayama
Tokushi Sato
Takahiro Sato
Makina Yabashi
Christian Bressler
author_sort Michael Diez
collection DOAJ
description Abstract We present a novel, highly versatile, and self-referenced arrival time monitor for measuring the femtosecond time delay between a hard X-ray pulse from a free-electron laser and an optical laser pulse, measured directly on the same sample used for pump-probe experiments. Two chirped and picosecond long optical supercontinuum pulses traverse the sample with a mutually fixed time delay of 970 fs, while a femtosecond X-ray pulse arrives at an instant in between both pulses. Behind the sample the supercontinuum pulses are temporally overlapped to yield near-perfect destructive interference in the absence of the X-ray pulse. Stimulation of the sample with an X-ray pulse delivers non-zero contributions at certain optical wavelengths, which serve as a measure of the relative arrival time of the X-ray pulse with an accuracy of better than 25 fs. We find an excellent agreement of our monitor with the existing timing diagnostics at the SACLA XFEL with a Pearson correlation value of 0.98. We demonstrate a high sensitivity to measure X-ray pulses with pulse energies as low as 30  $$\upmu $$ μ J. Using a free-flowing liquid jet as interaction sample ensures the full replacement of the sample volume for each X-ray/optical event, thus enabling its utility even at MHz repetition rate XFEL sources.
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spelling doaj.art-407ecbf25db34d298729ec35ebb867842022-12-21T21:20:35ZengNature PortfolioScientific Reports2045-23222021-02-0111111110.1038/s41598-021-82597-3A self-referenced in-situ arrival time monitor for X-ray free-electron lasersMichael Diez0Andreas Galler1Sebastian Schulz2Christina Boemer3Ryan N. Coffee4Nick Hartmann5Rupert Heider6Martin S. Wagner7Wolfram Helml8Tetsuo Katayama9Tokushi Sato10Takahiro Sato11Makina Yabashi12Christian Bressler13European XFEL GmbHEuropean XFEL GmbHEuropean XFEL GmbHEuropean XFEL GmbHSLAC National Accelerator LaboratorySLAC National Accelerator LaboratoryPhysik-Department E11, Technical University of MunichPhysik-Department E11, Technical University of MunichPhysik-Department E11, Technical University of MunichJapan Synchrotron Radiation Research InstituteCenter for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESYSLAC National Accelerator LaboratoryJapan Synchrotron Radiation Research InstituteEuropean XFEL GmbHAbstract We present a novel, highly versatile, and self-referenced arrival time monitor for measuring the femtosecond time delay between a hard X-ray pulse from a free-electron laser and an optical laser pulse, measured directly on the same sample used for pump-probe experiments. Two chirped and picosecond long optical supercontinuum pulses traverse the sample with a mutually fixed time delay of 970 fs, while a femtosecond X-ray pulse arrives at an instant in between both pulses. Behind the sample the supercontinuum pulses are temporally overlapped to yield near-perfect destructive interference in the absence of the X-ray pulse. Stimulation of the sample with an X-ray pulse delivers non-zero contributions at certain optical wavelengths, which serve as a measure of the relative arrival time of the X-ray pulse with an accuracy of better than 25 fs. We find an excellent agreement of our monitor with the existing timing diagnostics at the SACLA XFEL with a Pearson correlation value of 0.98. We demonstrate a high sensitivity to measure X-ray pulses with pulse energies as low as 30  $$\upmu $$ μ J. Using a free-flowing liquid jet as interaction sample ensures the full replacement of the sample volume for each X-ray/optical event, thus enabling its utility even at MHz repetition rate XFEL sources.https://doi.org/10.1038/s41598-021-82597-3
spellingShingle Michael Diez
Andreas Galler
Sebastian Schulz
Christina Boemer
Ryan N. Coffee
Nick Hartmann
Rupert Heider
Martin S. Wagner
Wolfram Helml
Tetsuo Katayama
Tokushi Sato
Takahiro Sato
Makina Yabashi
Christian Bressler
A self-referenced in-situ arrival time monitor for X-ray free-electron lasers
Scientific Reports
title A self-referenced in-situ arrival time monitor for X-ray free-electron lasers
title_full A self-referenced in-situ arrival time monitor for X-ray free-electron lasers
title_fullStr A self-referenced in-situ arrival time monitor for X-ray free-electron lasers
title_full_unstemmed A self-referenced in-situ arrival time monitor for X-ray free-electron lasers
title_short A self-referenced in-situ arrival time monitor for X-ray free-electron lasers
title_sort self referenced in situ arrival time monitor for x ray free electron lasers
url https://doi.org/10.1038/s41598-021-82597-3
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