Tackling Class Imbalance Problem in Software Defect Prediction Through Cluster-Based Over-Sampling With Filtering
In practice, Software Defect Prediction (SDP) models often suffer from highly imbalanced data, which makes classifiers difficult to identify defective instances. Recently, many techniques were proposed to tackle this problem, over-sampling technique is one of the most well-known methods to address c...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8861051/ |