Flatness measurement of large flat with two-station laser trackers
We present a novel method to accurately measure the flatness of a large flat. The method can be seen as a task-specific error correction of the laser tracker. Laser trackers are positioned at two specific measuring stations and measure the coordinates of the same sample points. The angular errors of...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
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Taylor & Francis Group
2018-01-01
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Series: | International Journal of Optomechatronics |
Subjects: | |
Online Access: | http://dx.doi.org/10.1080/15599612.2018.1529846 |
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author | Jie Li Jie Yang Shibin Wu Xuedong Cao |
author_facet | Jie Li Jie Yang Shibin Wu Xuedong Cao |
author_sort | Jie Li |
collection | DOAJ |
description | We present a novel method to accurately measure the flatness of a large flat. The method can be seen as a task-specific error correction of the laser tracker. Laser trackers are positioned at two specific measuring stations and measure the coordinates of the same sample points. The angular errors of the primary laser tracker are compensated with constraint information provided by an additional laser tracker. Using this method, we measure the flatness of a 4.5 m flat. The flatness measurement uncertainty is 1.4 µm in rms (root mean square). |
first_indexed | 2024-03-12T09:52:05Z |
format | Article |
id | doaj.art-4206270ae7ab44ce96b8c328d4154e80 |
institution | Directory Open Access Journal |
issn | 1559-9612 1559-9620 |
language | English |
last_indexed | 2024-03-12T09:52:05Z |
publishDate | 2018-01-01 |
publisher | Taylor & Francis Group |
record_format | Article |
series | International Journal of Optomechatronics |
spelling | doaj.art-4206270ae7ab44ce96b8c328d4154e802023-09-02T12:26:00ZengTaylor & Francis GroupInternational Journal of Optomechatronics1559-96121559-96202018-01-01121536210.1080/15599612.2018.15298461529846Flatness measurement of large flat with two-station laser trackersJie Li0Jie Yang1Shibin Wu2Xuedong Cao3Institute of Optics and Electronics, Chinese Academy of SciencesInstitute of Optics and Electronics, Chinese Academy of SciencesInstitute of Optics and Electronics, Chinese Academy of SciencesInstitute of Optics and Electronics, Chinese Academy of SciencesWe present a novel method to accurately measure the flatness of a large flat. The method can be seen as a task-specific error correction of the laser tracker. Laser trackers are positioned at two specific measuring stations and measure the coordinates of the same sample points. The angular errors of the primary laser tracker are compensated with constraint information provided by an additional laser tracker. Using this method, we measure the flatness of a 4.5 m flat. The flatness measurement uncertainty is 1.4 µm in rms (root mean square).http://dx.doi.org/10.1080/15599612.2018.1529846Flatness measurementlarge-scale metrologyerror compensationcoordinate measuring machinelaser tracker |
spellingShingle | Jie Li Jie Yang Shibin Wu Xuedong Cao Flatness measurement of large flat with two-station laser trackers International Journal of Optomechatronics Flatness measurement large-scale metrology error compensation coordinate measuring machine laser tracker |
title | Flatness measurement of large flat with two-station laser trackers |
title_full | Flatness measurement of large flat with two-station laser trackers |
title_fullStr | Flatness measurement of large flat with two-station laser trackers |
title_full_unstemmed | Flatness measurement of large flat with two-station laser trackers |
title_short | Flatness measurement of large flat with two-station laser trackers |
title_sort | flatness measurement of large flat with two station laser trackers |
topic | Flatness measurement large-scale metrology error compensation coordinate measuring machine laser tracker |
url | http://dx.doi.org/10.1080/15599612.2018.1529846 |
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