Monitored Tomographic Reconstruction—An Advanced Tool to Study the 3D Morphology of Nanomaterials

Monitored Tomographic Reconstruction—An Advanced Tool to Study the 3D Morphology of Nanomaterials

Detailed and accurate three-dimensional (3D) information about the morphology of hierarchically structured materials is derived from multi-scale X-ray computed tomography (XCT) and subsequent 3D data reconstruction. High-resolution X-ray microscopy and nano-XCT are suitable techniques to nondestruct...

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Bibliographic Details
Main Authors: Konstantin Bulatov, Marina Chukalina, Kristina Kutukova, Vlad Kohan, Anastasia Ingacheva, Alexey Buzmakov, Vladimir V. Arlazarov, Ehrenfried Zschech
Format: Article
Language:English
Published: MDPI AG 2021-09-01
Series:Nanomaterials
Subjects:
nano X-ray computed tomography
hierarchical structures
3D morphology
monitored reconstruction
stopping rule
time reducing
Online Access:https://www.mdpi.com/2079-4991/11/10/2524

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