Latent tracks of swift Bi ions in Si3N4
Parameters such as track diameter and microstruture of latent tracks in polycrystalline Si _3 N _4 induced by 710 MeV Bi ions were studied using TEM and XRD techniques, and MD simulation. Experimental results are considered in terms of the framework of a ‘core–shell’ inelastic thermal spike (i-TS) m...
Main Authors: | A Janse van Vuuren, A Ibrayeva, R A Rymzhanov, A Zhalmagambetova, J H O’Connell, V A Skuratov, V V Uglov, S V Zlotski, A E Volkov, M Zdorovets |
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Format: | Article |
Language: | English |
Published: |
IOP Publishing
2020-01-01
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Series: | Materials Research Express |
Subjects: | |
Online Access: | https://doi.org/10.1088/2053-1591/ab72d3 |
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