Study of interface reaction in a B4C/Cr mirror at elevated temperature using soft X-ray reflectivity

Study of interface reaction in a B4C/Cr mirror at elevated temperature using soft X-ray reflectivity

Boron carbide is a prominent material for high-brilliance synchrotron optics as it remains stable up to very high temperatures. The present study shows a significant change taking place at 550°C in the buried interface region formed between the Cr adhesive layer and the native oxide layer present on...

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Bibliographic Details
Main Authors: Mohammed H. Modi, Shruti Gupta, Praveen K. Yadav, Rajkumar Gupta, Aniruddha Bose, Chandrachur Mukherjee, Philippe Jonnard, Mourad Idir
Format: Article
Language:English
Published: International Union of Crystallography 2022-07-01
Series:Journal of Synchrotron Radiation
Subjects:
boron carbide
x-ray mirrors
synchrotron radiation
soft x-ray reflectivity
x-ray optics
Online Access:http://scripts.iucr.org/cgi-bin/paper?S1600577522004738

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