Modified Two-Point Correction Method for Wide-Spectrum LWIR Detection System
Non-uniformity commonly exists in the infrared focal plane, which behaves as the fixed-pattern noise (FPN) and seriously affects the image quality of long-wave infrared (LWIR) detection systems. The two-point correction (TPC) method is commonly used to reduce image FPN in engineering. However, when...
Main Authors: | Di Zhang, He Sun, Dejiang Wang, Jinghong Liu, Cheng Chen |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2023-02-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/23/4/2054 |
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