Influence of Thermal Phenomena on the Characteristics of Selected Electronics Networks
This paper presents the results of investigations on the influence of thermal phenomena—self-heating in semiconductor devices and mutual thermal couplings between them—on the characteristics of selected electronics networks containing bipolar transistors (BJTs) or insulated gate bipolar transistors...
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-08-01
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| Series: | Energies |
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| Online Access: | https://www.mdpi.com/1996-1073/14/16/4750 |
| _version_ | 1797524029882499072 |
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| author | Krzysztof Górecki Janusz Zarębski Paweł Górecki |
| author_facet | Krzysztof Górecki Janusz Zarębski Paweł Górecki |
| author_sort | Krzysztof Górecki |
| collection | DOAJ |
| description | This paper presents the results of investigations on the influence of thermal phenomena—self-heating in semiconductor devices and mutual thermal couplings between them—on the characteristics of selected electronics networks containing bipolar transistors (BJTs) or insulated gate bipolar transistors (IGBTs). Using the authors’ compact electrothermal models of the transistors mentioned above, the non-isothermal DC and dynamic characteristics of these devices and selected networks with these devices are calculated. Their selected characteristics are compared with the measurement results. The waveforms of currents in the considered networks are also determined taking into account thermal phenomena. Discrepancies between the obtained calculation and measurement results and the calculation results obtained without thermal phenomena are indicated. In particular, attention is paid to cooling conditions at which the networks under consideration may be damaged due to thermal phenomena. |
| first_indexed | 2024-03-10T08:51:30Z |
| format | Article |
| id | doaj.art-44c93f1560b94b17932847e4300d21b3 |
| institution | Directory Open Access Journal |
| issn | 1996-1073 |
| language | English |
| last_indexed | 2024-03-10T08:51:30Z |
| publishDate | 2021-08-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Energies |
| spelling | doaj.art-44c93f1560b94b17932847e4300d21b32023-11-22T07:26:52ZengMDPI AGEnergies1996-10732021-08-011416475010.3390/en14164750Influence of Thermal Phenomena on the Characteristics of Selected Electronics NetworksKrzysztof Górecki0Janusz Zarębski1Paweł Górecki2Department of Marine Electronics, Faculty of Electrical Engineering, Gdynia Maritime University, Morska 83, 81-225 Gdynia, PolandDepartment of Marine Electronics, Faculty of Electrical Engineering, Gdynia Maritime University, Morska 83, 81-225 Gdynia, PolandDepartment of Marine Electronics, Faculty of Electrical Engineering, Gdynia Maritime University, Morska 83, 81-225 Gdynia, PolandThis paper presents the results of investigations on the influence of thermal phenomena—self-heating in semiconductor devices and mutual thermal couplings between them—on the characteristics of selected electronics networks containing bipolar transistors (BJTs) or insulated gate bipolar transistors (IGBTs). Using the authors’ compact electrothermal models of the transistors mentioned above, the non-isothermal DC and dynamic characteristics of these devices and selected networks with these devices are calculated. Their selected characteristics are compared with the measurement results. The waveforms of currents in the considered networks are also determined taking into account thermal phenomena. Discrepancies between the obtained calculation and measurement results and the calculation results obtained without thermal phenomena are indicated. In particular, attention is paid to cooling conditions at which the networks under consideration may be damaged due to thermal phenomena.https://www.mdpi.com/1996-1073/14/16/4750thermal phenomenameasurementselectrothermal analysescompact electrothermal modelssemiconductor deviceselectronics networks |
| spellingShingle | Krzysztof Górecki Janusz Zarębski Paweł Górecki Influence of Thermal Phenomena on the Characteristics of Selected Electronics Networks Energies thermal phenomena measurements electrothermal analyses compact electrothermal models semiconductor devices electronics networks |
| title | Influence of Thermal Phenomena on the Characteristics of Selected Electronics Networks |
| title_full | Influence of Thermal Phenomena on the Characteristics of Selected Electronics Networks |
| title_fullStr | Influence of Thermal Phenomena on the Characteristics of Selected Electronics Networks |
| title_full_unstemmed | Influence of Thermal Phenomena on the Characteristics of Selected Electronics Networks |
| title_short | Influence of Thermal Phenomena on the Characteristics of Selected Electronics Networks |
| title_sort | influence of thermal phenomena on the characteristics of selected electronics networks |
| topic | thermal phenomena measurements electrothermal analyses compact electrothermal models semiconductor devices electronics networks |
| url | https://www.mdpi.com/1996-1073/14/16/4750 |
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