Characterization of the Uniformity of High-Flux CdZnTe Material

Characterization of the Uniformity of High-Flux CdZnTe Material

Since the late 2000s, the availability of high-quality cadmium zinc telluride (CdZnTe) has greatly increased. The excellent spectroscopic performance of this material has enabled the development of detectors with volumes exceeding 1 cm<sup>3</sup> for use in the detection of nuclear mate...

Full description

Bibliographic Details
Main Authors: Matthew Charles Veale, Paul Booker, Simon Cross, Matthew David Hart, Lydia Jowitt, John Lipp, Andreas Schneider, Paul Seller, Rhian Mair Wheater, Matthew David Wilson, Conny Christoffer Tobias Hansson, Krzysztof Iniewski, Pramodha Marthandam, Georgios Prekas
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Sensors
Subjects:
CdZnTe
pixel detector
X-ray detector
X-ray spectroscopy
X-ray imaging
high flux
Online Access:https://www.mdpi.com/1424-8220/20/10/2747

Internet

https://www.mdpi.com/1424-8220/20/10/2747

Similar Items