Wide field-of-view Fourier Ptychography microscopy based on Fresnel propagation scheme
Fourier ptychographic microscopy (FPM) is a computational imaging method that gives a significantly increased space-bandwidth product, in practice high resolution combined with a wide field of view. In this article, we propose an improved Fourier Ptychography algorithm based on Fresnel wave propagat...
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Format: | Article |
Language: | English |
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Elsevier
2022-08-01
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Series: | Results in Optics |
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Online Access: | http://www.sciencedirect.com/science/article/pii/S2666950122000499 |
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author | Mojde Hasanzade Dag Werner Breiby Muhammad Nadeem Akram |
author_facet | Mojde Hasanzade Dag Werner Breiby Muhammad Nadeem Akram |
author_sort | Mojde Hasanzade |
collection | DOAJ |
description | Fourier ptychographic microscopy (FPM) is a computational imaging method that gives a significantly increased space-bandwidth product, in practice high resolution combined with a wide field of view. In this article, we propose an improved Fourier Ptychography algorithm based on Fresnel wave propagation integral for wide field-of-view coherent imaging while correcting for the misalignment of the illuminating LED board and calibration of system parameters. In addition, the wave emanating from the LEDs is taken to be parabolic instead of plane wave as done by others. The advantage of this scheme is that it enables to simulate the transition regions between bright and dark field in wide image patches, and hence this feature can be used to estimate the LED misalignment as well as the distortion of the imaging lens. Experimental results are presented for a USAF resolution target and a biological sample for on-axis and off-axis image patches over a wide sample area showing excellent performance of this scheme when compared to the traditional Fraunhofer-model based Fourier Ptychography algorithm. The article summarizes with high technical detail our experiences with developing and implementing improved FPM methods and will hopefully assist other scientists entering this scientific field. |
first_indexed | 2024-04-13T05:42:06Z |
format | Article |
id | doaj.art-4547efcec5aa44d9a1a4383732280943 |
institution | Directory Open Access Journal |
issn | 2666-9501 |
language | English |
last_indexed | 2024-04-13T05:42:06Z |
publishDate | 2022-08-01 |
publisher | Elsevier |
record_format | Article |
series | Results in Optics |
spelling | doaj.art-4547efcec5aa44d9a1a43837322809432022-12-22T03:00:03ZengElsevierResults in Optics2666-95012022-08-018100259Wide field-of-view Fourier Ptychography microscopy based on Fresnel propagation schemeMojde Hasanzade0Dag Werner Breiby1Muhammad Nadeem Akram2Department of Microsystems, University of South-Eastern Norway, Raveien 215, Borre, Norway; Correspondence to: University of South-Eastern Norway (USN), NorwayDepartment of Microsystems, University of South-Eastern Norway, Raveien 215, Borre, Norway; PoreLab, Department of Physics, Norwegian University of Science and Technology(NTNU), Høgskoleringen 5, 7491 Trondheim, NorwayDepartment of Microsystems, University of South-Eastern Norway, Raveien 215, Borre, Norway; Correspondence to: University of South-Eastern Norway (USN), NorwayFourier ptychographic microscopy (FPM) is a computational imaging method that gives a significantly increased space-bandwidth product, in practice high resolution combined with a wide field of view. In this article, we propose an improved Fourier Ptychography algorithm based on Fresnel wave propagation integral for wide field-of-view coherent imaging while correcting for the misalignment of the illuminating LED board and calibration of system parameters. In addition, the wave emanating from the LEDs is taken to be parabolic instead of plane wave as done by others. The advantage of this scheme is that it enables to simulate the transition regions between bright and dark field in wide image patches, and hence this feature can be used to estimate the LED misalignment as well as the distortion of the imaging lens. Experimental results are presented for a USAF resolution target and a biological sample for on-axis and off-axis image patches over a wide sample area showing excellent performance of this scheme when compared to the traditional Fraunhofer-model based Fourier Ptychography algorithm. The article summarizes with high technical detail our experiences with developing and implementing improved FPM methods and will hopefully assist other scientists entering this scientific field.http://www.sciencedirect.com/science/article/pii/S2666950122000499Fourier PtychographyFresnel propagationPhase retrieval |
spellingShingle | Mojde Hasanzade Dag Werner Breiby Muhammad Nadeem Akram Wide field-of-view Fourier Ptychography microscopy based on Fresnel propagation scheme Results in Optics Fourier Ptychography Fresnel propagation Phase retrieval |
title | Wide field-of-view Fourier Ptychography microscopy based on Fresnel propagation scheme |
title_full | Wide field-of-view Fourier Ptychography microscopy based on Fresnel propagation scheme |
title_fullStr | Wide field-of-view Fourier Ptychography microscopy based on Fresnel propagation scheme |
title_full_unstemmed | Wide field-of-view Fourier Ptychography microscopy based on Fresnel propagation scheme |
title_short | Wide field-of-view Fourier Ptychography microscopy based on Fresnel propagation scheme |
title_sort | wide field of view fourier ptychography microscopy based on fresnel propagation scheme |
topic | Fourier Ptychography Fresnel propagation Phase retrieval |
url | http://www.sciencedirect.com/science/article/pii/S2666950122000499 |
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