Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress
Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under el...
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-08-01
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| Series: | Applied Sciences |
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| Online Access: | https://www.mdpi.com/2076-3417/11/16/7627 |
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| author | Gyeong Won Lee Yoonsuk Choi Heejin Kim Jongwoo Park Jong-In Shim Dong-Soo Shin |
| author_facet | Gyeong Won Lee Yoonsuk Choi Heejin Kim Jongwoo Park Jong-In Shim Dong-Soo Shin |
| author_sort | Gyeong Won Lee |
| collection | DOAJ |
| description | Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device. |
| first_indexed | 2024-03-10T09:01:13Z |
| format | Article |
| id | doaj.art-457179b0fb09493bac6cd5634cc7d6a5 |
| institution | Directory Open Access Journal |
| issn | 2076-3417 |
| language | English |
| last_indexed | 2024-03-10T09:01:13Z |
| publishDate | 2021-08-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Applied Sciences |
| spelling | doaj.art-457179b0fb09493bac6cd5634cc7d6a52023-11-22T06:44:29ZengMDPI AGApplied Sciences2076-34172021-08-011116762710.3390/app11167627Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical StressGyeong Won Lee0Yoonsuk Choi1Heejin Kim2Jongwoo Park3Jong-In Shim4Dong-Soo Shin5Department of Bionanotechnology, ERICA Campus, Hanyang University, Ansan 15588, Gyeonggi-do, KoreaOLED Technology Quality Reliability, Samsung Display, Asan 31454, Chungcheongnam-do, KoreaOLED Technology Quality Reliability, Samsung Display, Asan 31454, Chungcheongnam-do, KoreaOLED Technology Quality Reliability, Samsung Display, Asan 31454, Chungcheongnam-do, KoreaDepartment of Photonics and Nanoelectronics and BK21 FOUR ERICA-ACE Center, ERICA Campus, Hanyang University, Ansan 15588, Gyeonggi-do, KoreaDepartment of Photonics and Nanoelectronics and BK21 FOUR ERICA-ACE Center, ERICA Campus, Hanyang University, Ansan 15588, Gyeonggi-do, KoreaDespite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.https://www.mdpi.com/2076-3417/11/16/7627organic light-emitting diodesdegradationtransientcharge recombination and transport |
| spellingShingle | Gyeong Won Lee Yoonsuk Choi Heejin Kim Jongwoo Park Jong-In Shim Dong-Soo Shin Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress Applied Sciences organic light-emitting diodes degradation transient charge recombination and transport |
| title | Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress |
| title_full | Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress |
| title_fullStr | Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress |
| title_full_unstemmed | Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress |
| title_short | Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress |
| title_sort | analysis of transient degradation behaviors of organic light emitting diodes under electrical stress |
| topic | organic light-emitting diodes degradation transient charge recombination and transport |
| url | https://www.mdpi.com/2076-3417/11/16/7627 |
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