Improving the quality indicators and performance of logical blocks and static memory of the microprocessor as part of improving the energy efficiency of devices
The study is aimed at consideration of improving the energy efficiency of devices. The article discusses methods for ensuring resistance to heavy charged particles (HCP) of a microprocessor RAM unit . A description of the implementation and a block diagram of static memory based on dummy blocks is p...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2023-01-01
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| Series: | E3S Web of Conferences |
| Online Access: | https://www.e3s-conferences.org/articles/e3sconf/pdf/2023/97/e3sconf_bft2023_04020.pdf |
| _version_ | 1797345215461195776 |
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| author | Zolnikov Vladimir Reznichenko Vyacheslav Arakelyan Gleb Manukhina Lyubov |
| author_facet | Zolnikov Vladimir Reznichenko Vyacheslav Arakelyan Gleb Manukhina Lyubov |
| author_sort | Zolnikov Vladimir |
| collection | DOAJ |
| description | The study is aimed at consideration of improving the energy efficiency of devices. The article discusses methods for ensuring resistance to heavy charged particles (HCP) of a microprocessor RAM unit . A description of the implementation and a block diagram of static memory based on dummy blocks is provided. The work discusses methods of combating the biopolar effect, which are aimed at controlling the potential of the transistor body and reducing resistance. The dependence of the critical charge of a SOI memory cell on the gain of a parasitic biopolar transistor is modeled. To increase the fault tolerance of combinational circuits consisting of control logic and decoder blocks, redundancy is used at the level of individual gates. The article is considered to be useful for IT engineers and energy engineers, as well. |
| first_indexed | 2024-03-08T11:14:11Z |
| format | Article |
| id | doaj.art-45a9c06ef8e24e1d9aac3c37bd0f22a3 |
| institution | Directory Open Access Journal |
| issn | 2267-1242 |
| language | English |
| last_indexed | 2024-03-08T11:14:11Z |
| publishDate | 2023-01-01 |
| publisher | EDP Sciences |
| record_format | Article |
| series | E3S Web of Conferences |
| spelling | doaj.art-45a9c06ef8e24e1d9aac3c37bd0f22a32024-01-26T10:38:31ZengEDP SciencesE3S Web of Conferences2267-12422023-01-014600402010.1051/e3sconf/202346004020e3sconf_bft2023_04020Improving the quality indicators and performance of logical blocks and static memory of the microprocessor as part of improving the energy efficiency of devicesZolnikov Vladimir0Reznichenko Vyacheslav1Arakelyan Gleb2Manukhina Lyubov3Voronezh State Forest Engineering UniversityMoscow Aviation Institute (National Research University)Moscow Aviation Institute (National Research University)Moscow State University of Civil EngineeringThe study is aimed at consideration of improving the energy efficiency of devices. The article discusses methods for ensuring resistance to heavy charged particles (HCP) of a microprocessor RAM unit . A description of the implementation and a block diagram of static memory based on dummy blocks is provided. The work discusses methods of combating the biopolar effect, which are aimed at controlling the potential of the transistor body and reducing resistance. The dependence of the critical charge of a SOI memory cell on the gain of a parasitic biopolar transistor is modeled. To increase the fault tolerance of combinational circuits consisting of control logic and decoder blocks, redundancy is used at the level of individual gates. The article is considered to be useful for IT engineers and energy engineers, as well.https://www.e3s-conferences.org/articles/e3sconf/pdf/2023/97/e3sconf_bft2023_04020.pdf |
| spellingShingle | Zolnikov Vladimir Reznichenko Vyacheslav Arakelyan Gleb Manukhina Lyubov Improving the quality indicators and performance of logical blocks and static memory of the microprocessor as part of improving the energy efficiency of devices E3S Web of Conferences |
| title | Improving the quality indicators and performance of logical blocks and static memory of the microprocessor as part of improving the energy efficiency of devices |
| title_full | Improving the quality indicators and performance of logical blocks and static memory of the microprocessor as part of improving the energy efficiency of devices |
| title_fullStr | Improving the quality indicators and performance of logical blocks and static memory of the microprocessor as part of improving the energy efficiency of devices |
| title_full_unstemmed | Improving the quality indicators and performance of logical blocks and static memory of the microprocessor as part of improving the energy efficiency of devices |
| title_short | Improving the quality indicators and performance of logical blocks and static memory of the microprocessor as part of improving the energy efficiency of devices |
| title_sort | improving the quality indicators and performance of logical blocks and static memory of the microprocessor as part of improving the energy efficiency of devices |
| url | https://www.e3s-conferences.org/articles/e3sconf/pdf/2023/97/e3sconf_bft2023_04020.pdf |
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