Nonthermal Equilibrium Process of Charge Carrier Extraction in Metal/Insulator/Organic Semiconductor/Metal (MIOM) Junction
This paper presents the concept and experimental evidence for the nonthermal equilibrium (NTE) process of charge carrier extraction in metal/insulator/organic semiconductor/metal (MIOM) capacitors. These capacitors are structurally similar to metal/insulator/semiconductor/(metal) (MIS) capacitors fo...
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| Format: | Article |
| Language: | English |
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MDPI AG
2023-07-01
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| Series: | Magnetochemistry |
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| Online Access: | https://www.mdpi.com/2312-7481/9/7/180 |
| _version_ | 1797588482339635200 |
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| author | Hiroyuki Tajima Takeshi Oda Tomofumi Kadoya |
| author_facet | Hiroyuki Tajima Takeshi Oda Tomofumi Kadoya |
| author_sort | Hiroyuki Tajima |
| collection | DOAJ |
| description | This paper presents the concept and experimental evidence for the nonthermal equilibrium (NTE) process of charge carrier extraction in metal/insulator/organic semiconductor/metal (MIOM) capacitors. These capacitors are structurally similar to metal/insulator/semiconductor/(metal) (MIS) capacitors found in standard semiconductor textbooks. The difference between the two capacitors is that the (organic) semiconductor/metal contacts in the MIOM capacitors are of the Schottky type, whereas the contacts in the MIS capacitors are of the ohmic type. Moreover, the mobilities of most organic semiconductors are significantly lower than those of inorganic semiconductors. As the MIOM structure is identical to the electrode portion of an organic field-effect transistor (OFET) with top-contact and bottom-gate electrodes, the hysteretic behavior of the OFET transfer characteristics can be deduced from the NTE phenomenon observed in MIOM capacitors. |
| first_indexed | 2024-03-11T00:53:42Z |
| format | Article |
| id | doaj.art-4652c2ac28554840bb8ec75415f75173 |
| institution | Directory Open Access Journal |
| issn | 2312-7481 |
| language | English |
| last_indexed | 2024-03-11T00:53:42Z |
| publishDate | 2023-07-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Magnetochemistry |
| spelling | doaj.art-4652c2ac28554840bb8ec75415f751732023-11-18T20:13:39ZengMDPI AGMagnetochemistry2312-74812023-07-019718010.3390/magnetochemistry9070180Nonthermal Equilibrium Process of Charge Carrier Extraction in Metal/Insulator/Organic Semiconductor/Metal (MIOM) JunctionHiroyuki Tajima0Takeshi Oda1Tomofumi Kadoya2Graduate School of Science, University of Hyogo, 3-2-1 Kohto, Kamigori-cho 678-1297, JapanGraduate School of Science, University of Hyogo, 3-2-1 Kohto, Kamigori-cho 678-1297, JapanDepartment of Chemistry, Konan University, 8-9-1 Okamoto, Higashinada, Kobe 658-8501, JapanThis paper presents the concept and experimental evidence for the nonthermal equilibrium (NTE) process of charge carrier extraction in metal/insulator/organic semiconductor/metal (MIOM) capacitors. These capacitors are structurally similar to metal/insulator/semiconductor/(metal) (MIS) capacitors found in standard semiconductor textbooks. The difference between the two capacitors is that the (organic) semiconductor/metal contacts in the MIOM capacitors are of the Schottky type, whereas the contacts in the MIS capacitors are of the ohmic type. Moreover, the mobilities of most organic semiconductors are significantly lower than those of inorganic semiconductors. As the MIOM structure is identical to the electrode portion of an organic field-effect transistor (OFET) with top-contact and bottom-gate electrodes, the hysteretic behavior of the OFET transfer characteristics can be deduced from the NTE phenomenon observed in MIOM capacitors.https://www.mdpi.com/2312-7481/9/7/180hysteresisbias stress effectorganic semiconductorsorganic field-effect transistorsmetal/insulator/organic semiconductor/metalnon-thermal equilibrium process |
| spellingShingle | Hiroyuki Tajima Takeshi Oda Tomofumi Kadoya Nonthermal Equilibrium Process of Charge Carrier Extraction in Metal/Insulator/Organic Semiconductor/Metal (MIOM) Junction Magnetochemistry hysteresis bias stress effect organic semiconductors organic field-effect transistors metal/insulator/organic semiconductor/metal non-thermal equilibrium process |
| title | Nonthermal Equilibrium Process of Charge Carrier Extraction in Metal/Insulator/Organic Semiconductor/Metal (MIOM) Junction |
| title_full | Nonthermal Equilibrium Process of Charge Carrier Extraction in Metal/Insulator/Organic Semiconductor/Metal (MIOM) Junction |
| title_fullStr | Nonthermal Equilibrium Process of Charge Carrier Extraction in Metal/Insulator/Organic Semiconductor/Metal (MIOM) Junction |
| title_full_unstemmed | Nonthermal Equilibrium Process of Charge Carrier Extraction in Metal/Insulator/Organic Semiconductor/Metal (MIOM) Junction |
| title_short | Nonthermal Equilibrium Process of Charge Carrier Extraction in Metal/Insulator/Organic Semiconductor/Metal (MIOM) Junction |
| title_sort | nonthermal equilibrium process of charge carrier extraction in metal insulator organic semiconductor metal miom junction |
| topic | hysteresis bias stress effect organic semiconductors organic field-effect transistors metal/insulator/organic semiconductor/metal non-thermal equilibrium process |
| url | https://www.mdpi.com/2312-7481/9/7/180 |
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