The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope
The method of correcting software hysteresis piezoscanner atomic force microscope was proposed. The algorithm for correction was used for the samples of silicon, mica, polysulfone, and human erythrocytes, and platelets. It is shown that the proposed method can effectively eliminate the difference be...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
National Academy of Sciences of Belarus, State Scientific Institution “The Joint Institute of Mechanical Engineering"
2015-09-01
|
| Series: | Механика машин, механизмов и материалов |
| Subjects: | |
| Online Access: | http://mmmm.by/en/readers-en/archive-room-en?layout=edit&id=637 |
| Summary: | The method of correcting software hysteresis piezoscanner atomic force microscope was proposed. The algorithm for correction was used for the samples of silicon, mica, polysulfone, and human erythrocytes, and platelets. It is shown that the proposed method can effectively eliminate the difference between the curves of supply and discharge of the working area due to piezo hysteresis and is valid for different delay times between measurements at neighboring points of these curves. |
|---|---|
| ISSN: | 1995-0470 2518-1475 |