The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope
The method of correcting software hysteresis piezoscanner atomic force microscope was proposed. The algorithm for correction was used for the samples of silicon, mica, polysulfone, and human erythrocytes, and platelets. It is shown that the proposed method can effectively eliminate the difference be...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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National Academy of Sciences of Belarus, State Scientific Institution “The Joint Institute of Mechanical Engineering"
2015-09-01
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| Series: | Механика машин, механизмов и материалов |
| Subjects: | |
| Online Access: | http://mmmm.by/en/readers-en/archive-room-en?layout=edit&id=637 |
| _version_ | 1818922916873502720 |
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| author | Salem A.A. Mohammed Galina D. Melnikova Aleksandr A. Makhaniok Sergey A. Chizhik Natalya S. Kyzhel |
| author_facet | Salem A.A. Mohammed Galina D. Melnikova Aleksandr A. Makhaniok Sergey A. Chizhik Natalya S. Kyzhel |
| author_sort | Salem A.A. Mohammed |
| collection | DOAJ |
| description | The method of correcting software hysteresis piezoscanner atomic force microscope was proposed. The algorithm for correction was used for the samples of silicon, mica, polysulfone, and human erythrocytes, and platelets. It is shown that the proposed method can effectively eliminate the difference between the curves of supply and discharge of the working area due to piezo hysteresis and is valid for different delay times between measurements at neighboring points of these curves. |
| first_indexed | 2024-12-20T02:01:09Z |
| format | Article |
| id | doaj.art-471e8ec964024283b4d2a67618dbcb32 |
| institution | Directory Open Access Journal |
| issn | 1995-0470 2518-1475 |
| language | English |
| last_indexed | 2024-12-20T02:01:09Z |
| publishDate | 2015-09-01 |
| publisher | National Academy of Sciences of Belarus, State Scientific Institution “The Joint Institute of Mechanical Engineering" |
| record_format | Article |
| series | Механика машин, механизмов и материалов |
| spelling | doaj.art-471e8ec964024283b4d2a67618dbcb322022-12-21T19:57:19ZengNational Academy of Sciences of Belarus, State Scientific Institution “The Joint Institute of Mechanical Engineering"Механика машин, механизмов и материалов1995-04702518-14752015-09-013(32)7378The Method of Correction Hysteresis Piezoscanner Atomic Force MicroscopeSalem A.A. Mohammed 0Galina D. Melnikova 1Aleksandr A. Makhaniok2 Sergey A. Chizhik3Natalya S. Kyzhel 4Belarusian National Technical UniversityPresidium of the National Academy of Sciences of BelarusPresidium of the National Academy of Sciences of BelarusPresidium of the National Academy of Sciences of BelarusA.V. Luikov Heat and Mass Transfer Institute of the National Academy of Sciences of BelarusThe method of correcting software hysteresis piezoscanner atomic force microscope was proposed. The algorithm for correction was used for the samples of silicon, mica, polysulfone, and human erythrocytes, and platelets. It is shown that the proposed method can effectively eliminate the difference between the curves of supply and discharge of the working area due to piezo hysteresis and is valid for different delay times between measurements at neighboring points of these curves.http://mmmm.by/en/readers-en/archive-room-en?layout=edit&id=637piezo hysteresisstatic force spectroscopythe point of contact |
| spellingShingle | Salem A.A. Mohammed Galina D. Melnikova Aleksandr A. Makhaniok Sergey A. Chizhik Natalya S. Kyzhel The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope Механика машин, механизмов и материалов piezo hysteresis static force spectroscopy the point of contact |
| title | The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope |
| title_full | The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope |
| title_fullStr | The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope |
| title_full_unstemmed | The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope |
| title_short | The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope |
| title_sort | method of correction hysteresis piezoscanner atomic force microscope |
| topic | piezo hysteresis static force spectroscopy the point of contact |
| url | http://mmmm.by/en/readers-en/archive-room-en?layout=edit&id=637 |
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