Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens
Digital camera-based neutron imaging systems consisting of a neutron scintillator screen optically coupled to a digital camera are the most common digital neutron imaging system used in the neutron imaging community and are available at any state-of-the-art imaging facility world-wide. Neutron scint...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-06-01
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| Series: | Journal of Imaging |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2313-433X/6/7/56 |
| _version_ | 1797563868211314688 |
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| author | William C. Chuirazzi Aaron E. Craft |
| author_facet | William C. Chuirazzi Aaron E. Craft |
| author_sort | William C. Chuirazzi |
| collection | DOAJ |
| description | Digital camera-based neutron imaging systems consisting of a neutron scintillator screen optically coupled to a digital camera are the most common digital neutron imaging system used in the neutron imaging community and are available at any state-of-the-art imaging facility world-wide. Neutron scintillator screens are the integral component of these imaging system that directly interacts with the neutron beam and dictates the neutron capture efficiency and image quality limitations of the imaging system. This work describes a novel approach for testing neutron scintillators that provides a simple and efficient way to measure relative light yield and detection efficiency over a range of scintillator thicknesses using a single scintillator screen and only a few radiographs. Additionally, two methods for correlating the screen thickness to the measured data were implemented and compared. An example <sup>6</sup>LiF:ZnS scintillator screen with nominal thicknesses ranging from 0–300 μm was used to demonstrate this approach. The multi-thickness screen and image and data processing methods are not exclusive to neutron scintillator screens but could be applied to X-ray imaging as well. This approach has the potential to benefit the entire radiographic imaging community by offering an efficient path forward for manufacturers to develop higher-performance scintillators and for imaging facilities and service providers to determine the optimal screen parameters for their particular beam and imaging system. |
| first_indexed | 2024-03-10T18:49:16Z |
| format | Article |
| id | doaj.art-485448efd654449a82068dcd2cf02936 |
| institution | Directory Open Access Journal |
| issn | 2313-433X |
| language | English |
| last_indexed | 2024-03-10T18:49:16Z |
| publishDate | 2020-06-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Journal of Imaging |
| spelling | doaj.art-485448efd654449a82068dcd2cf029362023-11-20T05:15:51ZengMDPI AGJournal of Imaging2313-433X2020-06-01675610.3390/jimaging6070056Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator ScreensWilliam C. Chuirazzi0Aaron E. Craft1Idaho National Laboratory, Idaho Falls, ID 83415, USAIdaho National Laboratory, Idaho Falls, ID 83415, USADigital camera-based neutron imaging systems consisting of a neutron scintillator screen optically coupled to a digital camera are the most common digital neutron imaging system used in the neutron imaging community and are available at any state-of-the-art imaging facility world-wide. Neutron scintillator screens are the integral component of these imaging system that directly interacts with the neutron beam and dictates the neutron capture efficiency and image quality limitations of the imaging system. This work describes a novel approach for testing neutron scintillators that provides a simple and efficient way to measure relative light yield and detection efficiency over a range of scintillator thicknesses using a single scintillator screen and only a few radiographs. Additionally, two methods for correlating the screen thickness to the measured data were implemented and compared. An example <sup>6</sup>LiF:ZnS scintillator screen with nominal thicknesses ranging from 0–300 μm was used to demonstrate this approach. The multi-thickness screen and image and data processing methods are not exclusive to neutron scintillator screens but could be applied to X-ray imaging as well. This approach has the potential to benefit the entire radiographic imaging community by offering an efficient path forward for manufacturers to develop higher-performance scintillators and for imaging facilities and service providers to determine the optimal screen parameters for their particular beam and imaging system.https://www.mdpi.com/2313-433X/6/7/56neutron imagingneutron radiographydigital imagingscintillator screenscintillator developmentscintillator performance |
| spellingShingle | William C. Chuirazzi Aaron E. Craft Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens Journal of Imaging neutron imaging neutron radiography digital imaging scintillator screen scintillator development scintillator performance |
| title | Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens |
| title_full | Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens |
| title_fullStr | Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens |
| title_full_unstemmed | Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens |
| title_short | Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens |
| title_sort | measuring thickness dependent relative light yield and detection efficiency of scintillator screens |
| topic | neutron imaging neutron radiography digital imaging scintillator screen scintillator development scintillator performance |
| url | https://www.mdpi.com/2313-433X/6/7/56 |
| work_keys_str_mv | AT williamcchuirazzi measuringthicknessdependentrelativelightyieldanddetectionefficiencyofscintillatorscreens AT aaronecraft measuringthicknessdependentrelativelightyieldanddetectionefficiencyofscintillatorscreens |