Investigation of 1200 V SiC MOSFETs’ Surge Reliability

In this work, the surge reliability of 1200 V SiC metal-oxide-semiconductor field-effect transistors (MOSFETs) from various manufactures has been investigated in the reverse conduction mode. The surge current tests have been carried out in the channel conduction and non-conduction modes. The experim...

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书目详细资料
Main Authors: Huan Li, Jue Wang, Na Ren, Hongyi Xu, Kuang Sheng
格式: 文件
语言:English
出版: MDPI AG 2019-07-01
丛编:Micromachines
主题:
在线阅读:https://www.mdpi.com/2072-666X/10/7/485

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