APA (7th ed.) Citation

Nkuba, C. K., Kim, S., Dietrich, S., & Lee, H. (2022). Riding the IoT Wave With VFuzz: Discovering Security Flaws in Smart Homes. IEEE.

Chicago Style (17th ed.) Citation

Nkuba, Carlos Kayembe, Seulbae Kim, Sven Dietrich, and Heejo Lee. Riding the IoT Wave With VFuzz: Discovering Security Flaws in Smart Homes. IEEE, 2022.

MLA (9th ed.) Citation

Nkuba, Carlos Kayembe, et al. Riding the IoT Wave With VFuzz: Discovering Security Flaws in Smart Homes. IEEE, 2022.