Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures
The paper deals with testing device designed for experimental examination of processes in power electronics devices during various switching modes is described. Through the use of auxiliary circuits additional switching modes (ZVS, ZCS) are realized except hard switching, and turning-off with reduce...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
VSB-Technical University of Ostrava
2007-01-01
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| Series: | Advances in Electrical and Electronic Engineering |
| Subjects: | |
| Online Access: | http://advances.utc.sk/index.php/AEEE/article/view/219 |
| _version_ | 1827947708797681664 |
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| author | Pavol Spanik Branislav Dobrucky Michal Frivaldsky Peter Drgona Ivan Lokseninec |
| author_facet | Pavol Spanik Branislav Dobrucky Michal Frivaldsky Peter Drgona Ivan Lokseninec |
| author_sort | Pavol Spanik |
| collection | DOAJ |
| description | The paper deals with testing device designed for experimental examination of processes in power electronics devices during various switching modes is described. Through the use of auxiliary circuits additional switching modes (ZVS, ZCS) are realized except hard switching, and turning-off with reduced current respectively. The device´s advantage is possibility of fine dead time setting, allowing us analyzing the effects of phenomenon noted above, on measurements of commutation losses. |
| first_indexed | 2024-04-09T12:44:07Z |
| format | Article |
| id | doaj.art-499362a3ecdb46fc87c4e797163dfbff |
| institution | Directory Open Access Journal |
| issn | 1336-1376 1804-3119 |
| language | English |
| last_indexed | 2024-04-09T12:44:07Z |
| publishDate | 2007-01-01 |
| publisher | VSB-Technical University of Ostrava |
| record_format | Article |
| series | Advances in Electrical and Electronic Engineering |
| spelling | doaj.art-499362a3ecdb46fc87c4e797163dfbff2023-05-14T20:50:04ZengVSB-Technical University of OstravaAdvances in Electrical and Electronic Engineering1336-13761804-31192007-01-01615053154Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s StructuresPavol Spanik0Branislav DobruckyMichal FrivaldskyPeter DrgonaIvan LokseninecUniversity of ZilinaThe paper deals with testing device designed for experimental examination of processes in power electronics devices during various switching modes is described. Through the use of auxiliary circuits additional switching modes (ZVS, ZCS) are realized except hard switching, and turning-off with reduced current respectively. The device´s advantage is possibility of fine dead time setting, allowing us analyzing the effects of phenomenon noted above, on measurements of commutation losses.http://advances.utc.sk/index.php/AEEE/article/view/219power electronics deviceswitching modeauxiliary circuitdead time. |
| spellingShingle | Pavol Spanik Branislav Dobrucky Michal Frivaldsky Peter Drgona Ivan Lokseninec Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures Advances in Electrical and Electronic Engineering power electronics device switching mode auxiliary circuit dead time. |
| title | Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures |
| title_full | Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures |
| title_fullStr | Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures |
| title_full_unstemmed | Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures |
| title_short | Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures |
| title_sort | experimental analysis of communitation process of power semiconductor transistor s structures |
| topic | power electronics device switching mode auxiliary circuit dead time. |
| url | http://advances.utc.sk/index.php/AEEE/article/view/219 |
| work_keys_str_mv | AT pavolspanik experimentalanalysisofcommunitationprocessofpowersemiconductortransistorsstructures AT branislavdobrucky experimentalanalysisofcommunitationprocessofpowersemiconductortransistorsstructures AT michalfrivaldsky experimentalanalysisofcommunitationprocessofpowersemiconductortransistorsstructures AT peterdrgona experimentalanalysisofcommunitationprocessofpowersemiconductortransistorsstructures AT ivanlokseninec experimentalanalysisofcommunitationprocessofpowersemiconductortransistorsstructures |