The resistance change of the power diodes under the influence of the surge current impulses

The paper presents the investigations of causes of failure of the crystals of semiconductor power diodes while surge current pulses pass through them. It is shown that when currents values are lower than the surge current, the impact resistance and reliability of the diode do not change. At surge cu...

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Bibliographic Details
Main Authors: Tishchenko I. Yu., Soltys R. B., Savitskiy S. M., Pavljuk S. P.
Format: Article
Language:English
Published: Politehperiodika 2007-12-01
Series:Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Subjects:
Online Access:http://www.tkea.com.ua/tkea/2007/6_2007/pdf/08.zip

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