Deep Learning-Based Log Parsing for Monitoring Industrial ICT Systems
For rapidly developing smart manufacturing, Industrial ICT Systems (IICTSs) have become critical to safe and reliable production, and effective monitoring of complex IICTSs in practice is necessary but challenging. Since such monitoring data are organized generally as semi-structural logs, log parsi...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-03-01
|
| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/13/6/3691 |