Broadband extreme ultraviolet interferometry and imaging
Using a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. This is made possible by the adaptation of a birefringence-based ultrastable interferometer for infrared femtosecond pulses. S...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
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EDP Sciences
2019-01-01
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Series: | EPJ Web of Conferences |
Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2019/10/epjconf_up2019_02004.pdf |
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author | Jansen Matthijs de Beurs Anne Liu Kevin Eikema Kjeld Witte Stefan |
author_facet | Jansen Matthijs de Beurs Anne Liu Kevin Eikema Kjeld Witte Stefan |
author_sort | Jansen Matthijs |
collection | DOAJ |
description | Using a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. This is made possible by the adaptation of a birefringence-based ultrastable interferometer for infrared femtosecond pulses. Since we measure the interference with an EUV-sensitive CCD camera, this enables a wide range of spatially and spectrally resolved measurements at extreme ultraviolet wavelengths. We demonstrate the capabilities of this technique by performing wavelength-resolved high-resolution coherent diffractive imaging and by measuring the spatially resolved spectral absorption of a thin structured titanium film. |
first_indexed | 2024-12-17T02:09:39Z |
format | Article |
id | doaj.art-4aef1761d76d4ec7b2deed565944750d |
institution | Directory Open Access Journal |
issn | 2100-014X |
language | English |
last_indexed | 2024-12-17T02:09:39Z |
publishDate | 2019-01-01 |
publisher | EDP Sciences |
record_format | Article |
series | EPJ Web of Conferences |
spelling | doaj.art-4aef1761d76d4ec7b2deed565944750d2022-12-21T22:07:35ZengEDP SciencesEPJ Web of Conferences2100-014X2019-01-012050200410.1051/epjconf/201920502004epjconf_up2019_02004Broadband extreme ultraviolet interferometry and imagingJansen Matthijsde Beurs AnneLiu KevinEikema KjeldWitte StefanUsing a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. This is made possible by the adaptation of a birefringence-based ultrastable interferometer for infrared femtosecond pulses. Since we measure the interference with an EUV-sensitive CCD camera, this enables a wide range of spatially and spectrally resolved measurements at extreme ultraviolet wavelengths. We demonstrate the capabilities of this technique by performing wavelength-resolved high-resolution coherent diffractive imaging and by measuring the spatially resolved spectral absorption of a thin structured titanium film.https://www.epj-conferences.org/articles/epjconf/pdf/2019/10/epjconf_up2019_02004.pdf |
spellingShingle | Jansen Matthijs de Beurs Anne Liu Kevin Eikema Kjeld Witte Stefan Broadband extreme ultraviolet interferometry and imaging EPJ Web of Conferences |
title | Broadband extreme ultraviolet interferometry and imaging |
title_full | Broadband extreme ultraviolet interferometry and imaging |
title_fullStr | Broadband extreme ultraviolet interferometry and imaging |
title_full_unstemmed | Broadband extreme ultraviolet interferometry and imaging |
title_short | Broadband extreme ultraviolet interferometry and imaging |
title_sort | broadband extreme ultraviolet interferometry and imaging |
url | https://www.epj-conferences.org/articles/epjconf/pdf/2019/10/epjconf_up2019_02004.pdf |
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