Broadband extreme ultraviolet interferometry and imaging

Using a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. This is made possible by the adaptation of a birefringence-based ultrastable interferometer for infrared femtosecond pulses. S...

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Main Authors: Jansen Matthijs, de Beurs Anne, Liu Kevin, Eikema Kjeld, Witte Stefan
Format: Article
Language:English
Published: EDP Sciences 2019-01-01
Series:EPJ Web of Conferences
Online Access:https://www.epj-conferences.org/articles/epjconf/pdf/2019/10/epjconf_up2019_02004.pdf
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author Jansen Matthijs
de Beurs Anne
Liu Kevin
Eikema Kjeld
Witte Stefan
author_facet Jansen Matthijs
de Beurs Anne
Liu Kevin
Eikema Kjeld
Witte Stefan
author_sort Jansen Matthijs
collection DOAJ
description Using a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. This is made possible by the adaptation of a birefringence-based ultrastable interferometer for infrared femtosecond pulses. Since we measure the interference with an EUV-sensitive CCD camera, this enables a wide range of spatially and spectrally resolved measurements at extreme ultraviolet wavelengths. We demonstrate the capabilities of this technique by performing wavelength-resolved high-resolution coherent diffractive imaging and by measuring the spatially resolved spectral absorption of a thin structured titanium film.
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spelling doaj.art-4aef1761d76d4ec7b2deed565944750d2022-12-21T22:07:35ZengEDP SciencesEPJ Web of Conferences2100-014X2019-01-012050200410.1051/epjconf/201920502004epjconf_up2019_02004Broadband extreme ultraviolet interferometry and imagingJansen Matthijsde Beurs AnneLiu KevinEikema KjeldWitte StefanUsing a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. This is made possible by the adaptation of a birefringence-based ultrastable interferometer for infrared femtosecond pulses. Since we measure the interference with an EUV-sensitive CCD camera, this enables a wide range of spatially and spectrally resolved measurements at extreme ultraviolet wavelengths. We demonstrate the capabilities of this technique by performing wavelength-resolved high-resolution coherent diffractive imaging and by measuring the spatially resolved spectral absorption of a thin structured titanium film.https://www.epj-conferences.org/articles/epjconf/pdf/2019/10/epjconf_up2019_02004.pdf
spellingShingle Jansen Matthijs
de Beurs Anne
Liu Kevin
Eikema Kjeld
Witte Stefan
Broadband extreme ultraviolet interferometry and imaging
EPJ Web of Conferences
title Broadband extreme ultraviolet interferometry and imaging
title_full Broadband extreme ultraviolet interferometry and imaging
title_fullStr Broadband extreme ultraviolet interferometry and imaging
title_full_unstemmed Broadband extreme ultraviolet interferometry and imaging
title_short Broadband extreme ultraviolet interferometry and imaging
title_sort broadband extreme ultraviolet interferometry and imaging
url https://www.epj-conferences.org/articles/epjconf/pdf/2019/10/epjconf_up2019_02004.pdf
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AT debeursanne broadbandextremeultravioletinterferometryandimaging
AT liukevin broadbandextremeultravioletinterferometryandimaging
AT eikemakjeld broadbandextremeultravioletinterferometryandimaging
AT wittestefan broadbandextremeultravioletinterferometryandimaging