Yellow light emission from Ta2O5:Er, Eu, Ce thin films deposited using a simple co-sputtering method

Erbium, europium, and cerium co-doped tantalum oxide (Ta2O5:Er, Eu, Ce) thin films were prepared using a simple co-sputtering method, and yellow light emission was observed by the naked eye from a sample annealed at 900 °C for 20 min. The hexagonal Ta2O5 phase is very important, but the hexagonal Ce...

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Bibliographic Details
Main Authors: K. Miura, T. Osawa, T. Suzuki, Y. Yokota, O. Hanaizumi
Format: Article
Language:English
Published: Elsevier 2015-01-01
Series:Results in Physics
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S221137971400059X
Description
Summary:Erbium, europium, and cerium co-doped tantalum oxide (Ta2O5:Er, Eu, Ce) thin films were prepared using a simple co-sputtering method, and yellow light emission was observed by the naked eye from a sample annealed at 900 °C for 20 min. The hexagonal Ta2O5 phase is very important, but the hexagonal CeTa7O19 phase should be avoided to obtain strong yellow light emission from Ta2O5:Er, Eu, Ce films. The co-sputtered films can be used as high-refractive-index and yellow-light-emitting materials of autocloned photonic crystals that can be applied to novel light-emission devices, and they will also be used as anti-reflection and down-conversion layers toward high-efficiency silicon solar cells.
ISSN:2211-3797