Non-Destructive Imaging on Synthesised Nanoparticles
Our recently developed non-destructive imaging technique was applied for the characterisation of nanoparticles synthesised by X-ray radiolysis and the sol-gel method. The interfacial conditions between the nanoparticles and the substrates were observed by subtracting images taken by scanning electro...
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-01-01
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| Series: | Materials |
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| Online Access: | https://www.mdpi.com/1996-1944/14/3/613 |
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| author | Kelvin Elphick Akinobu Yamaguchi Akira Otsuki Neil Lonio Hayagan Atsufumi Hirohata |
| author_facet | Kelvin Elphick Akinobu Yamaguchi Akira Otsuki Neil Lonio Hayagan Atsufumi Hirohata |
| author_sort | Kelvin Elphick |
| collection | DOAJ |
| description | Our recently developed non-destructive imaging technique was applied for the characterisation of nanoparticles synthesised by X-ray radiolysis and the sol-gel method. The interfacial conditions between the nanoparticles and the substrates were observed by subtracting images taken by scanning electron microscopy at controlled electron acceleration voltages to allow backscattered electrons to be generated predominantly below and above the interfaces. The interfacial adhesion was found to be dependent on the solution pH used for the particle synthesis or particle suspension preparation, proving the change in the particle formation/deposition processes with pH as anticipated and agreed with the prediction based on the Derjaguin–Landau–Verwey–Overbeek (DLVO) theory. We found that our imaging technique was useful for the characterisation of interfaces hidden by nanoparticles to reveal the formation/deposition mechanism and can be extended to the other types of interfaces. |
| first_indexed | 2024-03-09T03:21:19Z |
| format | Article |
| id | doaj.art-4b04ca4e2acb4b7682777e40519f3bf8 |
| institution | Directory Open Access Journal |
| issn | 1996-1944 |
| language | English |
| last_indexed | 2024-03-09T03:21:19Z |
| publishDate | 2021-01-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Materials |
| spelling | doaj.art-4b04ca4e2acb4b7682777e40519f3bf82023-12-03T15:10:04ZengMDPI AGMaterials1996-19442021-01-0114361310.3390/ma14030613Non-Destructive Imaging on Synthesised NanoparticlesKelvin Elphick0Akinobu Yamaguchi1Akira Otsuki2Neil Lonio Hayagan3Atsufumi Hirohata4Department of Electronic Engineering, University of York, Heslington, York YO10 5DD, UKLaboratory of Advance Science and Technology for Industry, University of Hyogo, Hyogo 678-1205, JapanEcole Nationale Supérieure de Géologie, GeoRessources UMR 7359 CNRS, University of Lorraine, 2 Rue du Doyen Marcel Roubault, BP 10162, 54505 Vandoeuvre-lès-Nancy, FranceEcole Nationale Supérieure de Géologie, GeoRessources UMR 7359 CNRS, University of Lorraine, 2 Rue du Doyen Marcel Roubault, BP 10162, 54505 Vandoeuvre-lès-Nancy, FranceDepartment of Electronic Engineering, University of York, Heslington, York YO10 5DD, UKOur recently developed non-destructive imaging technique was applied for the characterisation of nanoparticles synthesised by X-ray radiolysis and the sol-gel method. The interfacial conditions between the nanoparticles and the substrates were observed by subtracting images taken by scanning electron microscopy at controlled electron acceleration voltages to allow backscattered electrons to be generated predominantly below and above the interfaces. The interfacial adhesion was found to be dependent on the solution pH used for the particle synthesis or particle suspension preparation, proving the change in the particle formation/deposition processes with pH as anticipated and agreed with the prediction based on the Derjaguin–Landau–Verwey–Overbeek (DLVO) theory. We found that our imaging technique was useful for the characterisation of interfaces hidden by nanoparticles to reveal the formation/deposition mechanism and can be extended to the other types of interfaces.https://www.mdpi.com/1996-1944/14/3/613scanning electron microscopybackscattered electronselectron flight simulationnanoparticlessynthesis |
| spellingShingle | Kelvin Elphick Akinobu Yamaguchi Akira Otsuki Neil Lonio Hayagan Atsufumi Hirohata Non-Destructive Imaging on Synthesised Nanoparticles Materials scanning electron microscopy backscattered electrons electron flight simulation nanoparticles synthesis |
| title | Non-Destructive Imaging on Synthesised Nanoparticles |
| title_full | Non-Destructive Imaging on Synthesised Nanoparticles |
| title_fullStr | Non-Destructive Imaging on Synthesised Nanoparticles |
| title_full_unstemmed | Non-Destructive Imaging on Synthesised Nanoparticles |
| title_short | Non-Destructive Imaging on Synthesised Nanoparticles |
| title_sort | non destructive imaging on synthesised nanoparticles |
| topic | scanning electron microscopy backscattered electrons electron flight simulation nanoparticles synthesis |
| url | https://www.mdpi.com/1996-1944/14/3/613 |
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