Variations in the Physical Properties of RF-Sputtered CdS Thin Films Observed at Substrate Temperatures Ranging from 25 °C to 500 °C

Variations in the Physical Properties of RF-Sputtered CdS Thin Films Observed at Substrate Temperatures Ranging from 25 °C to 500 °C

CdS films with a wide range of substrate temperatures as deposition parameters were fabricated on Corning Eagle 2000 glass substrates using RF magnetron sputtering. The crystallographic structure, microscopic surface texture, and stoichiometric and optical properties of each CdS film deposited at va...

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Bibliographic Details
Main Authors: Sangwoon Lee, Juna Kim, Seokhee Lee, Hyun-Jin Cha, Chang-Sik Son, Young-Guk Son, Donghyun Hwang
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Nanomaterials
Subjects:
cadmium sulfide
thin film
substrate temperature
RF magnetron sputtering
physical property
Online Access:https://www.mdpi.com/2079-4991/12/10/1618

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