Studying Some Electrical Properties for ZnSe Films Prepared by Using the Thermal Evaporation Method in vacuum

  Thin films of zinc selenide ZnSe have been prepared by using thermal evaporation method in vacuum with different thickness (1000 – 4000) Ao and a deposited on glass substrate and studying some electrical properties including the determination of A.C conductivity and real, imaginary parts of die...

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Main Authors: R.Y. Taha, A. M. Raouf
Format: Article
Language:English
Published: University of Baghdad 2017-05-01
Series:Ibn Al-Haitham Journal for Pure and Applied Sciences
Subjects:
Online Access:https://jih.uobaghdad.edu.iq/index.php/j/article/view/788
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author R.Y. Taha
A. M. Raouf
author_facet R.Y. Taha
A. M. Raouf
author_sort R.Y. Taha
collection DOAJ
description   Thin films of zinc selenide ZnSe have been prepared by using thermal evaporation method in vacuum with different thickness (1000 – 4000) Ao and a deposited on glass substrate and studying some electrical properties including the determination of A.C conductivity and real, imaginary parts of dielectric constant and tangent of loss angle. The result shows that increasing value of A.C conductivity with increasing thickness and temperature, and increasing capacitance value with increasing the temperature and decrease with increasing frequency . Real and imaginary parts of dielectric constant and tangent of loss angle decrease with increasing frequency
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spelling doaj.art-4b7c9afc25584e7984d0a1622270deb22022-12-22T02:54:08ZengUniversity of BaghdadIbn Al-Haitham Journal for Pure and Applied Sciences1609-40422521-34072017-05-01242Studying Some Electrical Properties for ZnSe Films Prepared by Using the Thermal Evaporation Method in vacuumR.Y. TahaA. M. Raouf   Thin films of zinc selenide ZnSe have been prepared by using thermal evaporation method in vacuum with different thickness (1000 – 4000) Ao and a deposited on glass substrate and studying some electrical properties including the determination of A.C conductivity and real, imaginary parts of dielectric constant and tangent of loss angle. The result shows that increasing value of A.C conductivity with increasing thickness and temperature, and increasing capacitance value with increasing the temperature and decrease with increasing frequency . Real and imaginary parts of dielectric constant and tangent of loss angle decrease with increasing frequency https://jih.uobaghdad.edu.iq/index.php/j/article/view/788:Semiconductors, thin films, Znse, electrical properties
spellingShingle R.Y. Taha
A. M. Raouf
Studying Some Electrical Properties for ZnSe Films Prepared by Using the Thermal Evaporation Method in vacuum
Ibn Al-Haitham Journal for Pure and Applied Sciences
:Semiconductors, thin films, Znse, electrical properties
title Studying Some Electrical Properties for ZnSe Films Prepared by Using the Thermal Evaporation Method in vacuum
title_full Studying Some Electrical Properties for ZnSe Films Prepared by Using the Thermal Evaporation Method in vacuum
title_fullStr Studying Some Electrical Properties for ZnSe Films Prepared by Using the Thermal Evaporation Method in vacuum
title_full_unstemmed Studying Some Electrical Properties for ZnSe Films Prepared by Using the Thermal Evaporation Method in vacuum
title_short Studying Some Electrical Properties for ZnSe Films Prepared by Using the Thermal Evaporation Method in vacuum
title_sort studying some electrical properties for znse films prepared by using the thermal evaporation method in vacuum
topic :Semiconductors, thin films, Znse, electrical properties
url https://jih.uobaghdad.edu.iq/index.php/j/article/view/788
work_keys_str_mv AT rytaha studyingsomeelectricalpropertiesforznsefilmspreparedbyusingthethermalevaporationmethodinvacuum
AT amraouf studyingsomeelectricalpropertiesforznsefilmspreparedbyusingthethermalevaporationmethodinvacuum