Enhancement of Deep Neural Network Recognition on MPSoC with Single Event Upset

Enhancement of Deep Neural Network Recognition on MPSoC with Single Event Upset

This paper introduces a new finding regarding single event upsets (SEUs) in configuration memory, and their potential impact on enhancing the performance of deep neural networks (DNNs) on the multiprocessor system on chip (MPSoC) platform. Traditionally, SEUs are considered to have negative effects...

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Bibliographic Details
Main Authors: Weitao Yang, Wuqing Song, Yaxin Guo, Yonghong Li, Chaohui He, Longsheng Wu, Bin Wang, Huan Liu, Guang Shi
Format: Article
Language:English
Published: MDPI AG 2023-12-01
Series:Micromachines
Subjects:
Zynq UltraScale+ MPSoC
single event upset
deep neural network
fault injection
enhancement
Online Access:https://www.mdpi.com/2072-666X/14/12/2215

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