Ultrafast High-Voltage Kicker System for Ion-Clearing Gaps
Ionization scattering of electron beams with residual gas molecules causes ion trapping in electron rings, both in a collider and electron cooling system. These trapped ions may cause emittance growth, tune shift, halo formation, and coherent coupled bunch instabilities. In order to clear the ions a...
| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-11-01
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| Series: | Photonics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2304-6732/8/11/507 |
| _version_ | 1797508720864788480 |
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| author | Alexander Yu. Smirnov Ronald Agustsson Stephen V. Benson Dmitry Gavryushkin Jiquan Guo Sergey V. Kutsaev Adam Moro Gunn Tae Park Alexei V. Smirnov Haipeng Wang Shukui Zhang |
| author_facet | Alexander Yu. Smirnov Ronald Agustsson Stephen V. Benson Dmitry Gavryushkin Jiquan Guo Sergey V. Kutsaev Adam Moro Gunn Tae Park Alexei V. Smirnov Haipeng Wang Shukui Zhang |
| author_sort | Alexander Yu. Smirnov |
| collection | DOAJ |
| description | Ionization scattering of electron beams with residual gas molecules causes ion trapping in electron rings, both in a collider and electron cooling system. These trapped ions may cause emittance growth, tune shift, halo formation, and coherent coupled bunch instabilities. In order to clear the ions and prevent them from accumulating turn after turn, the gaps in a temporal structure of the beam are typically used. Typically, the gap in the bunch train has a length of a few percent of the ring circumference. In those regions, the extraction electrodes with high pulsed voltages are introduced. In this paper, we present the design consideration and initial test results of the high-voltage pulsed kicker hardware that includes vacuum device and pulsed voltage driver, capable of achieving over 3 kV of deflecting voltage amplitude, rise and fall times of less than 10 ns, 100 ns flat-top duration at 1.4 MHz repetition rate. |
| first_indexed | 2024-03-10T05:08:50Z |
| format | Article |
| id | doaj.art-4c8c10f5b5714a8f81b566b4d55ddef2 |
| institution | Directory Open Access Journal |
| issn | 2304-6732 |
| language | English |
| last_indexed | 2024-03-10T05:08:50Z |
| publishDate | 2021-11-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Photonics |
| spelling | doaj.art-4c8c10f5b5714a8f81b566b4d55ddef22023-11-23T01:01:45ZengMDPI AGPhotonics2304-67322021-11-0181150710.3390/photonics8110507Ultrafast High-Voltage Kicker System for Ion-Clearing GapsAlexander Yu. Smirnov0Ronald Agustsson1Stephen V. Benson2Dmitry Gavryushkin3Jiquan Guo4Sergey V. Kutsaev5Adam Moro6Gunn Tae Park7Alexei V. Smirnov8Haipeng Wang9Shukui Zhang10RadiaBeam Technologies, LLC, Santa Monica, CA 90404, USARadiaBeam Technologies, LLC, Santa Monica, CA 90404, USAThomas Jefferson National Accelerator Facility, Newport News, VA 23606, USARadiaBeam Technologies, LLC, Santa Monica, CA 90404, USAThomas Jefferson National Accelerator Facility, Newport News, VA 23606, USARadiaBeam Technologies, LLC, Santa Monica, CA 90404, USARadiaBeam Technologies, LLC, Santa Monica, CA 90404, USAThomas Jefferson National Accelerator Facility, Newport News, VA 23606, USARadiaBeam Technologies, LLC, Santa Monica, CA 90404, USAThomas Jefferson National Accelerator Facility, Newport News, VA 23606, USAThomas Jefferson National Accelerator Facility, Newport News, VA 23606, USAIonization scattering of electron beams with residual gas molecules causes ion trapping in electron rings, both in a collider and electron cooling system. These trapped ions may cause emittance growth, tune shift, halo formation, and coherent coupled bunch instabilities. In order to clear the ions and prevent them from accumulating turn after turn, the gaps in a temporal structure of the beam are typically used. Typically, the gap in the bunch train has a length of a few percent of the ring circumference. In those regions, the extraction electrodes with high pulsed voltages are introduced. In this paper, we present the design consideration and initial test results of the high-voltage pulsed kicker hardware that includes vacuum device and pulsed voltage driver, capable of achieving over 3 kV of deflecting voltage amplitude, rise and fall times of less than 10 ns, 100 ns flat-top duration at 1.4 MHz repetition rate.https://www.mdpi.com/2304-6732/8/11/507electron-ion colliderbeam kickerhigh voltageelectron cooling |
| spellingShingle | Alexander Yu. Smirnov Ronald Agustsson Stephen V. Benson Dmitry Gavryushkin Jiquan Guo Sergey V. Kutsaev Adam Moro Gunn Tae Park Alexei V. Smirnov Haipeng Wang Shukui Zhang Ultrafast High-Voltage Kicker System for Ion-Clearing Gaps Photonics electron-ion collider beam kicker high voltage electron cooling |
| title | Ultrafast High-Voltage Kicker System for Ion-Clearing Gaps |
| title_full | Ultrafast High-Voltage Kicker System for Ion-Clearing Gaps |
| title_fullStr | Ultrafast High-Voltage Kicker System for Ion-Clearing Gaps |
| title_full_unstemmed | Ultrafast High-Voltage Kicker System for Ion-Clearing Gaps |
| title_short | Ultrafast High-Voltage Kicker System for Ion-Clearing Gaps |
| title_sort | ultrafast high voltage kicker system for ion clearing gaps |
| topic | electron-ion collider beam kicker high voltage electron cooling |
| url | https://www.mdpi.com/2304-6732/8/11/507 |
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