An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractiv...

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Bibliographic Details
Main Authors: Tiryaki Erhan, Kocahan Özlem, Özder Serhat
Format: Article
Language:English
Published: Sciendo 2021-04-01
Series:Measurement Science Review
Subjects:
dielectric film
refractive index
reflectance spectrum
continuous wavelet transform
generalized morse wavelet
Online Access:https://doi.org/10.2478/msr-2021-0009

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