Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO<sub>2</sub> Mixed Oxide Thin Films
We report the synthesis and characterization of pure ZnO, pure CeO<sub>2</sub>, and ZnO:CeO<sub>2</sub> mixed oxide thin films dip-coated on glass substrates using a sol-gel technique. The structural properties of as-prepared thin film are investigated using the XRD technique...
| Main Authors: | , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-11-01
|
| Series: | Photonics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2304-6732/7/4/112 |
| _version_ | 1797547555350904832 |
|---|---|
| author | Qais M. Al-Bataineh Mahmoud Telfah Ahmad A. Ahmad Ahmad M. Alsaad Issam A. Qattan Hakim Baaziz Zoulikha Charifi Ahmad Telfah |
| author_facet | Qais M. Al-Bataineh Mahmoud Telfah Ahmad A. Ahmad Ahmad M. Alsaad Issam A. Qattan Hakim Baaziz Zoulikha Charifi Ahmad Telfah |
| author_sort | Qais M. Al-Bataineh |
| collection | DOAJ |
| description | We report the synthesis and characterization of pure ZnO, pure CeO<sub>2</sub>, and ZnO:CeO<sub>2</sub> mixed oxide thin films dip-coated on glass substrates using a sol-gel technique. The structural properties of as-prepared thin film are investigated using the XRD technique. In particular, pure ZnO thin film is found to exhibit a hexagonal structure, while pure CeO<sub>2</sub> thin film is found to exhibit a fluorite cubic structure. The diffraction patterns also show the formation of mixed oxide materials containing well-dispersed phases of semi-crystalline nature from both constituent oxides. Furthermore, optical properties of thin films are investigated by performing UV–Vis spectrophotometer measurements. In the visible region, transmittance of all investigated thin films attains values as high as 85%. Moreover, refractive index of pure ZnO film was found to exhibit values ranging between 1.57 and 1.85 while for CeO<sub>2</sub> thin film, it exhibits values ranging between 1.73 and 2.25 as the wavelength of incident light decreases from 700 nm to 400 nm. Remarkably, refractive index of ZnO:CeO<sub>2</sub> mixed oxide-thin films are tuned by controlling the concentration of CeO<sub>2</sub> properly. Mixed oxide-thin films of controllable refractive indices constitute an important class of smart functional materials. We have also investigated the optoelectronic and dispersion properties of ZnO:CeO<sub>2</sub> mixed oxide-thin films by employing well-established classical models. The melodramatic boost of optical and optoelectronic properties of ZnO:CeO<sub>2</sub> mixed oxide thin films establish a strong ground to modify these properties in a skillful manner enabling their use as key potential candidates for the fabrication of scaled optoelectronic devices and thin film transistors. |
| first_indexed | 2024-03-10T14:45:43Z |
| format | Article |
| id | doaj.art-4cec74d5cd364a20be9557d37c2a0ace |
| institution | Directory Open Access Journal |
| issn | 2304-6732 |
| language | English |
| last_indexed | 2024-03-10T14:45:43Z |
| publishDate | 2020-11-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Photonics |
| spelling | doaj.art-4cec74d5cd364a20be9557d37c2a0ace2023-11-20T21:24:46ZengMDPI AGPhotonics2304-67322020-11-017411210.3390/photonics7040112Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO<sub>2</sub> Mixed Oxide Thin FilmsQais M. Al-Bataineh0Mahmoud Telfah1Ahmad A. Ahmad2Ahmad M. Alsaad3Issam A. Qattan4Hakim Baaziz5Zoulikha Charifi6Ahmad Telfah7Department of Physical Sciences, Jordan University of Science and Technology, P.O. Box 3030, Irbid 22110, JordanDepartment of Physical Sciences, Jordan University of Science and Technology, P.O. Box 3030, Irbid 22110, JordanDepartment of Physical Sciences, Jordan University of Science and Technology, P.O. Box 3030, Irbid 22110, JordanDepartment of Physical Sciences, Jordan University of Science and Technology, P.O. Box 3030, Irbid 22110, JordanDepartment of Physics, Khalifa University of Science and Technology, P.O. Box 127788, Abu Dhabi 127788, UAEDepartment of Physics, Faculty of Science, University of M’sila, M’sila 28000, AlgeriaDepartment of Physics, Faculty of Science, University of M’sila, M’sila 28000, AlgeriaLeibniz Institut für Analytische Wissenschaften-ISAS-e.V., Bunsen-Kirchhoff-Straße 11, 44139 Dortmund, GermanyWe report the synthesis and characterization of pure ZnO, pure CeO<sub>2</sub>, and ZnO:CeO<sub>2</sub> mixed oxide thin films dip-coated on glass substrates using a sol-gel technique. The structural properties of as-prepared thin film are investigated using the XRD technique. In particular, pure ZnO thin film is found to exhibit a hexagonal structure, while pure CeO<sub>2</sub> thin film is found to exhibit a fluorite cubic structure. The diffraction patterns also show the formation of mixed oxide materials containing well-dispersed phases of semi-crystalline nature from both constituent oxides. Furthermore, optical properties of thin films are investigated by performing UV–Vis spectrophotometer measurements. In the visible region, transmittance of all investigated thin films attains values as high as 85%. Moreover, refractive index of pure ZnO film was found to exhibit values ranging between 1.57 and 1.85 while for CeO<sub>2</sub> thin film, it exhibits values ranging between 1.73 and 2.25 as the wavelength of incident light decreases from 700 nm to 400 nm. Remarkably, refractive index of ZnO:CeO<sub>2</sub> mixed oxide-thin films are tuned by controlling the concentration of CeO<sub>2</sub> properly. Mixed oxide-thin films of controllable refractive indices constitute an important class of smart functional materials. We have also investigated the optoelectronic and dispersion properties of ZnO:CeO<sub>2</sub> mixed oxide-thin films by employing well-established classical models. The melodramatic boost of optical and optoelectronic properties of ZnO:CeO<sub>2</sub> mixed oxide thin films establish a strong ground to modify these properties in a skillful manner enabling their use as key potential candidates for the fabrication of scaled optoelectronic devices and thin film transistors.https://www.mdpi.com/2304-6732/7/4/112zinc oxide (ZnO)ceria (CeO<sub>2</sub>)mixed oxidesX-ray diffraction (XRD)FTIR spectroscopyUV–vis spectroscopy |
| spellingShingle | Qais M. Al-Bataineh Mahmoud Telfah Ahmad A. Ahmad Ahmad M. Alsaad Issam A. Qattan Hakim Baaziz Zoulikha Charifi Ahmad Telfah Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO<sub>2</sub> Mixed Oxide Thin Films Photonics zinc oxide (ZnO) ceria (CeO<sub>2</sub>) mixed oxides X-ray diffraction (XRD) FTIR spectroscopy UV–vis spectroscopy |
| title | Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO<sub>2</sub> Mixed Oxide Thin Films |
| title_full | Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO<sub>2</sub> Mixed Oxide Thin Films |
| title_fullStr | Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO<sub>2</sub> Mixed Oxide Thin Films |
| title_full_unstemmed | Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO<sub>2</sub> Mixed Oxide Thin Films |
| title_short | Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO<sub>2</sub> Mixed Oxide Thin Films |
| title_sort | synthesis crystallography microstructure crystal defects optical and optoelectronic properties of zno ceo sub 2 sub mixed oxide thin films |
| topic | zinc oxide (ZnO) ceria (CeO<sub>2</sub>) mixed oxides X-ray diffraction (XRD) FTIR spectroscopy UV–vis spectroscopy |
| url | https://www.mdpi.com/2304-6732/7/4/112 |
| work_keys_str_mv | AT qaismalbataineh synthesiscrystallographymicrostructurecrystaldefectsopticalandoptoelectronicpropertiesofznoceosub2submixedoxidethinfilms AT mahmoudtelfah synthesiscrystallographymicrostructurecrystaldefectsopticalandoptoelectronicpropertiesofznoceosub2submixedoxidethinfilms AT ahmadaahmad synthesiscrystallographymicrostructurecrystaldefectsopticalandoptoelectronicpropertiesofznoceosub2submixedoxidethinfilms AT ahmadmalsaad synthesiscrystallographymicrostructurecrystaldefectsopticalandoptoelectronicpropertiesofznoceosub2submixedoxidethinfilms AT issamaqattan synthesiscrystallographymicrostructurecrystaldefectsopticalandoptoelectronicpropertiesofznoceosub2submixedoxidethinfilms AT hakimbaaziz synthesiscrystallographymicrostructurecrystaldefectsopticalandoptoelectronicpropertiesofznoceosub2submixedoxidethinfilms AT zoulikhacharifi synthesiscrystallographymicrostructurecrystaldefectsopticalandoptoelectronicpropertiesofznoceosub2submixedoxidethinfilms AT ahmadtelfah synthesiscrystallographymicrostructurecrystaldefectsopticalandoptoelectronicpropertiesofznoceosub2submixedoxidethinfilms |