Science Opportunities at the SwissFEL X-ray Laser

Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude higher than that of a synchrotron. These pulses will allow studies of femtosecond dynam...

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Main Authors: Bruce D. Patterson, Jakub Szlachentko, Bill Pedrini, Luc Patthey, Christopher Milne, Gerhard Ingold, Catherine Dejoiea, Hans H. Braun, Paul Beaud, Rafael Abela
Format: Article
Language:deu
Published: Swiss Chemical Society 2014-02-01
Series:CHIMIA
Subjects:
Online Access:https://www.chimia.ch/chimia/article/view/5512
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author Bruce D. Patterson
Jakub Szlachentko
Bill Pedrini
Luc Patthey
Christopher Milne
Gerhard Ingold
Catherine Dejoiea
Hans H. Braun
Paul Beaud
Rafael Abela
author_facet Bruce D. Patterson
Jakub Szlachentko
Bill Pedrini
Luc Patthey
Christopher Milne
Gerhard Ingold
Catherine Dejoiea
Hans H. Braun
Paul Beaud
Rafael Abela
author_sort Bruce D. Patterson
collection DOAJ
description Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude higher than that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce diffraction images of organic and inorganic nanostructures without deleterious effects of radiation damage.
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spelling doaj.art-4d21742075c84aa99b4c5c1ca824ad712022-12-22T00:01:01ZdeuSwiss Chemical SocietyCHIMIA0009-42932673-24242014-02-01681-210.2533/chimia.2014.73Science Opportunities at the SwissFEL X-ray LaserBruce D. Patterson0Jakub Szlachentko1Bill Pedrini2Luc Patthey3Christopher Milne4Gerhard Ingold5Catherine Dejoiea6Hans H. Braun7Paul Beaud8Rafael Abela9SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, SwitzerlandSwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, SwitzerlandSwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, SwitzerlandSwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, SwitzerlandSwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, SwitzerlandSwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, SwitzerlandSwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland; Laboratorium für Kristallographie ETH Zürich CH-8093 Zürich, SwitzerlandSwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, SwitzerlandSwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, SwitzerlandSwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland. rafael.abela@psi.ch Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude higher than that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce diffraction images of organic and inorganic nanostructures without deleterious effects of radiation damage. https://www.chimia.ch/chimia/article/view/5512Cross correlationsFree electron laserPhotochemistryPump and probe experimentsSingle shot spectroscopyX-ray diffraction
spellingShingle Bruce D. Patterson
Jakub Szlachentko
Bill Pedrini
Luc Patthey
Christopher Milne
Gerhard Ingold
Catherine Dejoiea
Hans H. Braun
Paul Beaud
Rafael Abela
Science Opportunities at the SwissFEL X-ray Laser
CHIMIA
Cross correlations
Free electron laser
Photochemistry
Pump and probe experiments
Single shot spectroscopy
X-ray diffraction
title Science Opportunities at the SwissFEL X-ray Laser
title_full Science Opportunities at the SwissFEL X-ray Laser
title_fullStr Science Opportunities at the SwissFEL X-ray Laser
title_full_unstemmed Science Opportunities at the SwissFEL X-ray Laser
title_short Science Opportunities at the SwissFEL X-ray Laser
title_sort science opportunities at the swissfel x ray laser
topic Cross correlations
Free electron laser
Photochemistry
Pump and probe experiments
Single shot spectroscopy
X-ray diffraction
url https://www.chimia.ch/chimia/article/view/5512
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