Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-rays

This paper describes an application of infrared light-induced de-polarization applied on a polarized CdZnTe detector working under high radiation fluxes. We newly demonstrate the influence of a high flux of X-rays and simultaneous 1200-nm LED illumination on the spectroscopic properties of a CdZnTe...

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Main Authors: Jakub Pekárek, Václav Dědič, Jan Franc, Eduard Belas, Martin Rejhon, Pavel Moravec, Jan Touš, Josef Voltr
Format: Article
Language:English
Published: MDPI AG 2016-09-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/16/10/1591
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author Jakub Pekárek
Václav Dědič
Jan Franc
Eduard Belas
Martin Rejhon
Pavel Moravec
Jan Touš
Josef Voltr
author_facet Jakub Pekárek
Václav Dědič
Jan Franc
Eduard Belas
Martin Rejhon
Pavel Moravec
Jan Touš
Josef Voltr
author_sort Jakub Pekárek
collection DOAJ
description This paper describes an application of infrared light-induced de-polarization applied on a polarized CdZnTe detector working under high radiation fluxes. We newly demonstrate the influence of a high flux of X-rays and simultaneous 1200-nm LED illumination on the spectroscopic properties of a CdZnTe detector. CdZnTe detectors operating under high radiation fluxes usually suffer from the polarization effect, which occurs due to a screening of the internal electric field by a positive space charge caused by photogenerated holes trapped at a deep level. Polarization results in the degradation of detector charge collection efficiency. We studied the spectroscopic behavior of CdZnTe under various X-ray fluxes ranging between 5 × 10 5 and 8 × 10 6 photons per mm 2 per second. It was observed that polarization occurs at an X-ray flux higher than 3 × 10 6 mm − 2 ·s − 1 . Using simultaneous illumination of the detector by a de-polarizing LED at 1200 nm, it was possible to recover X-ray spectra originally deformed by the polarization effect.
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spelling doaj.art-4e2161689c4e4e49b3fed055cc7d7cbd2022-12-22T03:19:06ZengMDPI AGSensors1424-82202016-09-011610159110.3390/s16101591s16101591Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-raysJakub Pekárek0Václav Dědič1Jan Franc2Eduard Belas3Martin Rejhon4Pavel Moravec5Jan Touš6Josef Voltr7Institute of Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, Prague 12116, Czech RepublicInstitute of Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, Prague 12116, Czech RepublicInstitute of Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, Prague 12116, Czech RepublicInstitute of Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, Prague 12116, Czech RepublicInstitute of Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, Prague 12116, Czech RepublicInstitute of Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, Prague 12116, Czech RepublicCrytur Ltd., Palackého 175, Turnov 51101, Czech RepublicNational Radiation Protection Institute, Bartoškova 28, Prague 14000, Czech RepublicThis paper describes an application of infrared light-induced de-polarization applied on a polarized CdZnTe detector working under high radiation fluxes. We newly demonstrate the influence of a high flux of X-rays and simultaneous 1200-nm LED illumination on the spectroscopic properties of a CdZnTe detector. CdZnTe detectors operating under high radiation fluxes usually suffer from the polarization effect, which occurs due to a screening of the internal electric field by a positive space charge caused by photogenerated holes trapped at a deep level. Polarization results in the degradation of detector charge collection efficiency. We studied the spectroscopic behavior of CdZnTe under various X-ray fluxes ranging between 5 × 10 5 and 8 × 10 6 photons per mm 2 per second. It was observed that polarization occurs at an X-ray flux higher than 3 × 10 6 mm − 2 ·s − 1 . Using simultaneous illumination of the detector by a de-polarizing LED at 1200 nm, it was possible to recover X-ray spectra originally deformed by the polarization effect.http://www.mdpi.com/1424-8220/16/10/1591CdZnTeX-ray detectorhigh fluxpolarizationde-polarizationPockels effect
spellingShingle Jakub Pekárek
Václav Dědič
Jan Franc
Eduard Belas
Martin Rejhon
Pavel Moravec
Jan Touš
Josef Voltr
Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-rays
Sensors
CdZnTe
X-ray detector
high flux
polarization
de-polarization
Pockels effect
title Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-rays
title_full Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-rays
title_fullStr Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-rays
title_full_unstemmed Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-rays
title_short Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-rays
title_sort infrared led enhanced spectroscopic cdznte detector working under high fluxes of x rays
topic CdZnTe
X-ray detector
high flux
polarization
de-polarization
Pockels effect
url http://www.mdpi.com/1424-8220/16/10/1591
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