Automatic Cephalometric Landmark Detection on X-ray Images Using a Deep-Learning Method
Accurate automatic quantitative cephalometry are essential for orthodontics. However, manual labeling of cephalometric landmarks is tedious and subjective, which also must be performed by professional doctors. In recent years, deep learning has gained attention for its success in computer vision fie...
Main Authors: | Yu Song, Xu Qiao, Yutaro Iwamoto, Yen-wei Chen |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-04-01
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Series: | Applied Sciences |
Subjects: | |
Online Access: | https://www.mdpi.com/2076-3417/10/7/2547 |
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